1.

Conference Proceedings
Conference Proceedings
1. Improvement in total measurement uncertainty for gate CD control [5878-24]
Bunday, B. D. ; Sirjgabu, O. ; Wen, Y. ; Paranipe, A. ; Terbeek, P. ; Allgair, J. ; Peterson, A.,
Pub. info.: Advanced characterization techniques for optics, semiconductors, and nanotechnologies II : 2-4 August, 2005, San Diego, California, USA.  pp.58780M-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5878
2.

Conference Proceedings
Conference Proceedings
2. Individual photon counting using e2v L3 CCDs for low background astronomical spectroscopy [6276-56]
Wen, Y. ; Rauscher, B. J. ; Baker, R. G. ; Clampin, M. C. ; Fochie, P. ; Heap, S. R. ; Hilton, G. ; Jorden, P. R. ; Linder, D. ; Mott, B. ; Pool, P. ; Waczynski, A. ; Woodgarte, B.
Pub. info.: High energy, optical, and infrared detectors for astronomy II : 24-27 May, 2006, Orlando, Florida, USA.  pp.62761H-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6276
3.

Conference Proceedings
Conference Proceedings
3. Model of fringing in the WFC3 CCDs
Malumuth, E.M. ; Hill, R.J. ; Cheng, E.S. ; Cottingham, D.A. ; Wen, Y. ; Johnson, S.D. ; Hill, R.S.
Pub. info.: Future EUV/UV and visible space astrophysics missions and instrumentation : 22-23 August 2002, Waikoloa, Hawaii, USA.  pp.567-576,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4854
4.

Conference Proceedings
Conference Proceedings
4. CD variation control based on accurate characterization of 193-nm material and CD metrology
Wen, Y. ; Pois, H. ; Opsal, J.
Pub. info.: Advanced microlithography technologies : 8-10 November, 2004, Beijing, China.  pp.154-163,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5645
5.

Conference Proceedings
Conference Proceedings
5. A study of hot pixel annealing in the Hubble Space Telescope Wide Field Camera 3 CCDs
Polidan, E. J. ; Waczynski, A. ; Marshall, P. ; Johnson, S. D. ; Marshall, C. ; Reed, R. ; Kimbie, R. A. ; Delo, G. ; Schlossberg, D. ; Russell, A. M. ; Beck, T. ; Wen, Y. ; Yagelowich, J. ; Hill, R. J.
Pub. info.: Optical, infrared, and millimeter space telescopes : 21-25 June 2004, Glasgow, Scotland, United Kingdom.  pp.289-298,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5487
6.

Conference Proceedings
Conference Proceedings
6. Mobile instrument for intelligent leak detection and location on underground water supply pipelines
Wen, Y. ; Li, P. ; Na, X. ; Yang, J.
Pub. info.: Smart structures and materials 2005 : Smart sensor technology and measurement systems : 7-9 March 2005, San Diego, California, USA.  pp.156-167,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5758
7.

Conference Proceedings
Conference Proceedings
7. Selection of the infrared detectors for Wide Field Camera 3 on the Hubble Space Telescope
Robberto, M. ; Stiavelli, M. ; Baggett, S.M. ; Hilbert, B. ; MacKenty, J.W. ; Kimble, R.A. ; Hill, R.J. ; Cottingham, D.A. ; Delo, G. ; Johnson, S.D. ; Landsman, W. ; Malumuth, E.M. ; Polidan, E.J. ; Russell, A.M. ; Waczynski, A. ; Wassell, E. ; Wen, Y. ; Haas, A.K. ; Montroy, J.T. ; Piquette, E.C. ; Vural, K. ; Cabelli, C.A. ; Hall, D.N.B.
Pub. info.: Focal plane arrays for space telescopes : 4-6 August 2003, San Diego, California, USA.  pp.166-174,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5167
8.

Conference Proceedings
Conference Proceedings
8. Radiation effects in WFC3 IR detectors
Johnson, S.D. ; Waczynski, A. ; Marshall, P.W. ; Polidan, E.J. ; Marshall, C.J. ; Reed, R.A. ; Kimble, R.A. ; Delo, G. ; Schlossberg, D. ; Russell, A.M. ; Beck, T. ; Wen, Y. ; Yagelowich, J. ; Hill, R.J. ; Wassell, E. ; Cheng, E.S.
Pub. info.: Focal plane arrays for space telescopes : 4-6 August 2003, San Diego, California, USA.  pp.243-257,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5167
9.

Conference Proceedings
Conference Proceedings
9. Hot pixel behavior in WFC3 CCD detectors irradiated under operational conditions
Polidan, E.J. ; Waczynski, A. ; Marshall, P.W. ; Johnson, S.D. ; Marshall, C.J. ; Reed, R.A. ; Kimble, R.A. ; Delo, G. ; Schlossberg, D. ; Russell, A.M. ; Beck, T. ; Wen, Y. ; Yagelowich, J. ; Hill, R.J. ; Wassell, E.
Pub. info.: Focal plane arrays for space telescopes : 4-6 August 2003, San Diego, California, USA.  pp.258-269,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5167
10.

Conference Proceedings
Conference Proceedings
10. Stress Controlled Magnetomechanical Instability in Terfenol-D Thin Films
Su, Quanmin ; Wen, Y. ; Wuttig, Manfred
Pub. info.: Thin-films : stresses and mechanical properties VII : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A..  pp.595-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 505
11.

Conference Proceedings
Conference Proceedings
11. Fluorescence detection of neoplastic growths in vivo
Wu, T.T. ; Cheung, T.H. ; Lo, K.W. ; Wen, Y. ; Qu, J.Y.
Pub. info.: Diagnostic optical spectroscopy in biomedicine II : 24-25 June 2003, Munich, Germany.  pp.58-63,  2003.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5141
12.

Conference Proceedings
Conference Proceedings
12. Combined classifier for discriminating cancerous tissue from normal tissue using light-induced autofluorescence
Lin, W.M. ; Yuan, X. ; Yuen, P.W. ; Sham, J. ; Wei, W.I. ; Wen, Y. ; Shi, P.C. ; Qu, J.Y.
Pub. info.: Diagnostic optical spectroscopy in biomedicine II : 24-25 June 2003, Munich, Germany.  pp.177-186,  2003.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5141
13.

Conference Proceedings
Conference Proceedings
13. A resonant coding passive wireless SAW sensor array system
Li, P. ; Wen, Y.
Pub. info.: Smart structures and materials 2005 : Smart sensor technology and measurement systems : 7-9 March 2005, San Diego, California, USA.  pp.462-470,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5758
14.

Conference Proceedings
Conference Proceedings
14. Characterization of concrete stress by measuring dissipation factors of embedded piezoelectric ceramic disc
Chen, Y. ; Wen, Y. ; Li, P.
Pub. info.: Smart structures and materials 2005 : Sensors and smart structures technologies for civil, mechanical, and aerospace systems : 7-10 March 2005, San Diego, California, USA.  pp.30-41,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5765
15.

Conference Proceedings
Conference Proceedings
15. Detectors for the James Webb Space Telescope near-infrared spectrograph
Rauscher, B. J. ; Figer, D. F. ; Regan, M. W. ; Boker, T. ; Garnett, J. ; Hill, R. J. ; Bagnasco, G. ; Balleza, J. ; Barney, R. ; Bergeron, L. E. ; Brambora, C. ; Connelly, J. ; Derro, R. ; DiPirro, M. J. ; Doria-Warner, C. ; Ericsson, A. ; Glazer, S. D. ; Greene, C. ; Hall, D. N. B. ; Jacobson, S. ; Jakobsen, P. ; Johnson, E. ; Johnson, S. D. ; Krebs, C. ; Krebs, D. J. ; Lambros, S. D. ; Likins, B. ; Manthripragada, S. ; Martineau, R. J. ; Morse, E. C. ; Moseley, S. H. ; Mott, D. B. ; Muench, T. ; Park, H. ; Parker, S. ; Polidan, E. J. ; Rashford, R. ; Shakoorzadeh, K. ; Sharma, R. ; Strada, P. ; Waczynski, A. ; Wen, Y. ; Wong, S. ; Yagelowich, J. ; Zuray, M.
Pub. info.: Optical, infrared, and millimeter space telescopes : 21-25 June 2004, Glasgow, Scotland, United Kingdom.  pp.710-726,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5487
16.

Conference Proceedings
Conference Proceedings
16. The infrared detectors for the Wide Field Camera 3 on HST
Robberto, M. ; Baggett, S. M. ; Hilbert, B. ; MacKenty, J. W. ; Kimble, R. A. ; Hill, R. J. ; Cottingham, D. A. ; Delo, G. ; Johnson, S. D. ; Landsman, W. ; Malumuth, E. M. ; Polidan, E. ; Russell, A. M. ; Waczynski, A. ; Wassell, E. ; Wen, Y. ; Haas, A. ; Montroy, J. T. ; Piquette, E. C. ; Vural, K. ; Cabelli, C. ; Hall, D. N. B.
Pub. info.: Optical and infrared detectors for astronomy : 21-22 June 2004, Glasgow, Scotland, United Kingdom.  pp.15-22,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5499
17.

Conference Proceedings
Conference Proceedings
17. Finite Element Modeling of Adaptive Composite
Wen, Y. ; Denis, S. ; Gautier, E. ; Roytburd, A. L.
Pub. info.: Materials for smart systems II : sympsoium held December 2-5, 1996, Boston, Massachusetts, U.S.A..  pp.155-,  1997.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 459
18.

Technical Paper
Technical Paper
18. Effect of Temperature Dependent Properties and Particle Shape on Heat Transfer in Plasma Flow.
Wen, Y. ; Jog, M. A.
Pub. info.: A.S.M.E. paper.  2003.  New York, NY.  American Society of Mechanical Engineers
Title of ser.: ASME Technical Paper : IMECE
Ser. no.: 2003
19.

Technical Paper
Technical Paper
19. Vehicle Rollover Propensity Measurement Using a Novel Approach.
Oral, H.A. ; Kemp, K. ; Hoenke, M. ; Wen, Y. ; Barber, J.
Pub. info.: 2003 SAE world congress : technical paper.  2003.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2003
20.

Technical Paper
Technical Paper
20. An Innovative Real Time Modeling, Simulation and Distributed Control Application.
Oral, H.A. ; White, K. ; Wen, Y.
Pub. info.: 2004 SAE world congress : technical paper.  2004.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2004
21.

Conference Proceedings
Conference Proceedings
21. Contact hole application for lithography process development using the Opti-Probe three-dimensional RT/CD technology
Jiang, Z. ; Sorkhabi, O. ; Chu, H. ; Cao, X.L. ; Li, G. ; Wen, Y. ; Opsal, J.L. ; Chang, Y.-C.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVIII.  pp.1364-1373,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5375
22.

Conference Proceedings
Conference Proceedings
22. Contact hole inspection by real-time optical CD metrology
Opsal, J.L. ; Chu, H. ; Wen, Y. ; Li, G. ; Chang, Y.-C.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVII.  1  pp.597-607,  2003.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5038
23.

Conference Proceedings
Conference Proceedings
23. Real-time optical CD metrology for litho process
Opsal, J.L. ; Wen, Y. ; Lee, J. ; Smith, W.L.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVII.  1  pp.496-507,  2003.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5038
24.

Conference Proceedings
Conference Proceedings
24. Characterization of gratings by Mueller polarimetry in conical diffraction
Sorkhabi, O. ; Pois, H. ; Chu, H. ; Wen, Y. ; Opsol, J. ; Kim, W. D.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XIX.  pp.217-228,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5752
25.

Conference Proceedings
Conference Proceedings
25. Fundamental solutions for real-time optical CD metrology
Opsai, J.L. ; Chu, H. ; Wen, Y. ; Chang, Y.C. ; Li, G.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVI.  Part One  pp.163-176,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4689