1.

Conference Proceedings
Conference Proceedings
1. Improvement in total measurement uncertainty for gate CD control [5878-24]
Bunday, B. D. ; Sirjgabu, O. ; Wen, Y. ; Paranipe, A. ; Terbeek, P. ; Allgair, J. ; Peterson, A.,
Pub. info.: Advanced characterization techniques for optics, semiconductors, and nanotechnologies II : 2-4 August, 2005, San Diego, California, USA.  pp.58780M-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5878
2.

Conference Proceedings
Conference Proceedings
2. Individual photon counting using e2v L3 CCDs for low background astronomical spectroscopy [6276-56]
Wen, Y. ; Rauscher, B. J. ; Baker, R. G. ; Clampin, M. C. ; Fochie, P. ; Heap, S. R. ; Hilton, G. ; Jorden, P. R. ; Linder, D. ; Mott, B. ; Pool, P. ; Waczynski, A. ; Woodgarte, B.
Pub. info.: High energy, optical, and infrared detectors for astronomy II : 24-27 May, 2006, Orlando, Florida, USA.  pp.62761H-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6276
3.

Conference Proceedings
Conference Proceedings
3. Model of fringing in the WFC3 CCDs
Malumuth, E.M. ; Hill, R.J. ; Cheng, E.S. ; Cottingham, D.A. ; Wen, Y. ; Johnson, S.D. ; Hill, R.S.
Pub. info.: Future EUV/UV and visible space astrophysics missions and instrumentation : 22-23 August 2002, Waikoloa, Hawaii, USA.  pp.567-576,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4854
4.

Conference Proceedings
Conference Proceedings
4. CD variation control based on accurate characterization of 193-nm material and CD metrology
Wen, Y. ; Pois, H. ; Opsal, J.
Pub. info.: Advanced microlithography technologies : 8-10 November, 2004, Beijing, China.  pp.154-163,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5645
5.

Conference Proceedings
Conference Proceedings
5. A study of hot pixel annealing in the Hubble Space Telescope Wide Field Camera 3 CCDs
Polidan, E. J. ; Waczynski, A. ; Marshall, P. ; Johnson, S. D. ; Marshall, C. ; Reed, R. ; Kimbie, R. A. ; Delo, G. ; Schlossberg, D. ; Russell, A. M. ; Beck, T. ; Wen, Y. ; Yagelowich, J. ; Hill, R. J.
Pub. info.: Optical, infrared, and millimeter space telescopes : 21-25 June 2004, Glasgow, Scotland, United Kingdom.  pp.289-298,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5487
6.

Conference Proceedings
Conference Proceedings
6. Mobile instrument for intelligent leak detection and location on underground water supply pipelines
Wen, Y. ; Li, P. ; Na, X. ; Yang, J.
Pub. info.: Smart structures and materials 2005 : Smart sensor technology and measurement systems : 7-9 March 2005, San Diego, California, USA.  pp.156-167,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5758
7.

Conference Proceedings
Conference Proceedings
7. Selection of the infrared detectors for Wide Field Camera 3 on the Hubble Space Telescope
Robberto, M. ; Stiavelli, M. ; Baggett, S.M. ; Hilbert, B. ; MacKenty, J.W. ; Kimble, R.A. ; Hill, R.J. ; Cottingham, D.A. ; Delo, G. ; Johnson, S.D. ; Landsman, W. ; Malumuth, E.M. ; Polidan, E.J. ; Russell, A.M. ; Waczynski, A. ; Wassell, E. ; Wen, Y. ; Haas, A.K. ; Montroy, J.T. ; Piquette, E.C. ; Vural, K. ; Cabelli, C.A. ; Hall, D.N.B.
Pub. info.: Focal plane arrays for space telescopes : 4-6 August 2003, San Diego, California, USA.  pp.166-174,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5167
8.

Conference Proceedings
Conference Proceedings
8. Radiation effects in WFC3 IR detectors
Johnson, S.D. ; Waczynski, A. ; Marshall, P.W. ; Polidan, E.J. ; Marshall, C.J. ; Reed, R.A. ; Kimble, R.A. ; Delo, G. ; Schlossberg, D. ; Russell, A.M. ; Beck, T. ; Wen, Y. ; Yagelowich, J. ; Hill, R.J. ; Wassell, E. ; Cheng, E.S.
Pub. info.: Focal plane arrays for space telescopes : 4-6 August 2003, San Diego, California, USA.  pp.243-257,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5167
9.

Conference Proceedings
Conference Proceedings
9. Hot pixel behavior in WFC3 CCD detectors irradiated under operational conditions
Polidan, E.J. ; Waczynski, A. ; Marshall, P.W. ; Johnson, S.D. ; Marshall, C.J. ; Reed, R.A. ; Kimble, R.A. ; Delo, G. ; Schlossberg, D. ; Russell, A.M. ; Beck, T. ; Wen, Y. ; Yagelowich, J. ; Hill, R.J. ; Wassell, E.
Pub. info.: Focal plane arrays for space telescopes : 4-6 August 2003, San Diego, California, USA.  pp.258-269,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5167
10.

Conference Proceedings
Conference Proceedings
10. Stress Controlled Magnetomechanical Instability in Terfenol-D Thin Films
Su, Quanmin ; Wen, Y. ; Wuttig, Manfred
Pub. info.: Thin-films : stresses and mechanical properties VII : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A..  pp.595-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 505