1.

Conference Proceedings

Conference Proceedings
Khachaturyan,K. ; Weber,E.R. ; Horigan,J. ; Ford,W.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.2  pp.881-886,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87
2.

Conference Proceedings

Conference Proceedings
Hoinkis,M. ; Baranowski,J. ; Dreszer,P. ; Weber,E.R. ; Grimmeiss,H.G.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.2  pp.841-846,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87
3.

Conference Proceedings

Conference Proceedings
Li,M.-F. ; Yu,P.Y. ; Weber,E.R. ; Bauser,E. ; Hansen,W.L. ; Haller,E.E.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.2  pp.853-858,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87
4.

Conference Proceedings

Conference Proceedings
Leon,R.P. ; Kaminska,M. ; Yu,K.M. ; Liliental-Weber,Z. ; Weber,E.R.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.2  pp.723-728,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87
5.

Conference Proceedings

Conference Proceedings
Istratov,A.A. ; Flink,C. ; Baluasubramanian,S. ; Weber,E.R. ; Hieslmair,H. ; McHugo,S.A. ; Hedemann,H. ; Seibt,M. ; Schroter,W.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.258-277,  2000.  Pennington, N.J., Bellingham, Wash..  Electrochemical Society — SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4218
6.

Conference Proceedings

Conference Proceedings
Gebauer,J. ; Krause-Rehberg,R. ; Eichler,S. ; Bauer-Kugelmann,W. ; Kogel,G. ; Triftshauser,W. ; Luysberg,M. ; Sohn,H. ; Weber,E.R.
Pub. info.: Positron annihilation, ICPA-11 : Proceedings of the 11th International Conference on Positron Annihilation, Kansas City, Missouri, USA, May 1997.  pp.204-208,  1997.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 255-257
7.

Conference Proceedings

Conference Proceedings
Li,M.F. ; Yu,P.Y. ; Shan,W. ; Hansen,W.L. ; Weber,E.R.
Pub. info.: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part2  pp.851-856,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 38-41
8.

Conference Proceedings

Conference Proceedings
Jager,N.D. ; Dreszer,P. ; Newman,N. ; Verma,A.K. ; Liiiental-Weber,Z. ; Weber,E.R.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.3  pp.1599-1604,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
9.

Conference Proceedings

Conference Proceedings
Kruger,J. ; Corlatan,D. ; Kisielowski,C. ; Kim,Y. ; Klockenbrink,R. ; Sudhir,G.S. ; Rubin,M. ; Weber,E.R.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.1191-1196,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
10.

Conference Proceedings

Conference Proceedings
MeHugo,S.A. ; Hieslmair,H. ; Weber,E.R.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1979-1984,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201