1.

Conference Proceedings

Conference Proceedings
Wilkening,W. ; Kaufmann,U. ; Schneider,J. ; Schonherr,E. ; Glaser,E.R. ; Shanabrook,B.V. ; Waterman,J.R. ; Wagner,R.J.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.2  pp.793-798,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87
2.

Conference Proceedings

Conference Proceedings
Shanabrook,B.V. ; Barvosa-Carter,W. ; Bass,R. ; Bennett,B.R. ; Boos,J.B. ; Bewley,W.W. ; Bracker,A.S. ; Culbertson,J.C. ; Glaser,E.R. ; Kruppa,W. ; Magno,R. ; Moore,W.J. ; Meyer,J.R. ; Nosho,B.Z. ; Thibado,P.M. ; Twigg,M.E. ; Wagner,R.J. ; Waterman,J.R. ; Whitman,L.J.
Pub. info.: Engineered nanostructural films and materials : 22-23 July 1999, Denver, Colorado.  pp.13-22,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3790