Data mining and knowledge discovery : theory, tools, and technology III : 16-17 April 2001, Orlando, USA. pp.313-322, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Optical remote sensing of the atmosphere and clouds II : 9-12 October 2000, Sendai, Japan. pp.258-265, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Signal and data processing of small targets 2001 : 30 July-2 August 2001, San Diego, USA. pp.511-519, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Image compression and encryption technologies : 22-24 October 2001, Wuhan, China. pp.220-224, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Proceedings of the 16th International Modal Analysis Conference February 2-5, 1998 Fess Parker's Doubletree Resort Santa Barbara, California. Part1 pp.251-257, 1998. Bethel, CT. Society for Experimental Mechanics
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Proceedings of SPIE - the International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Laser diodes and leds in industrial, measurement, imaging, and sensors applications II : testing, packaging, and reliability of semiconductor lasers V : 26-25 January 2000, San Jose, California. pp.193-201, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China. pp.130-132, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Integrated optic devices II : 28-30 January 1998, San Jose, California. pp.340-345, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China. pp.404-407, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Advanced signal processing algorithms, architectures, and implementations XI : 1-3 August, 2001, San Diego, [Calif.] USA. pp.484-490, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Lasers in surgery : advanced characterization, therapeutics, and systems XI : 20-23 January 2001, San Jose, USA. pp.468-473, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Process imaging for automatic control : 5-6 November 2000, Boston, USA. pp.191-200, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Medical imaging 2001 : PACS and integrated medical information systems : design and evaluation : 20-22 February 2001, San Diego, USA. pp.73-82, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Advanced optical manufacturing and testing technology : 1-3 November 2000, Chengdu, China. pp.566-568, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Medical imaging 2001 : PACS and integrated medical information systems : design and evaluation : 20-22 February 2001, San Diego, USA. pp.316-324, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Automated optical inspection for industry : 6-7 November 1996, Beijing, China. pp.197-203, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Automated optical inspection for industry : 6-7 November 1996, Beijing, China. pp.192-196, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Satellite remote sensing of clouds and the atmosphere II : 23-25 September 1997, London, UK. pp.291-294, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Earth observing systems V : 2-4 August 2000, San Diego, USA. pp.281-293, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Imaging spectrometry V : 19-21 July 1999, Denver, Colorado. pp.95-99, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Imaging spectrometry V : 19-21 July 1999, Denver, Colorado. pp.80-85, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Process imaging for automatic control : 5-6 November 2000, Boston, USA. pp.114-121, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical diagnostics of living cells III : 24-25 January 2000, San Jose, California. pp.197-204, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical interconnects for telecommunication and data communications, 8-10 November 2000, Beijing, China. pp.255-258, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical interconnects for telecommunication and data communications, 8-10 November 2000, Beijing, China. pp.249-254, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Human vision and electronic imaging V : 24-27 January 2000, San Jose, USA. pp.16-27, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical interconnects for telecommunication and data communications, 8-10 November 2000, Beijing, China. pp.263-266, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical interconnects for telecommunication and data communications, 8-10 November 2000, Beijing, China. pp.259-262, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical interconnects for telecommunication and data communications, 8-10 November 2000, Beijing, China. pp.245-248, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Synthesis and properties of mechanically alloyed and nanocrystalline materials : ISMANAM-96 : proceedings of the International Symposium on Metastable, Mechanically Alloyed and Nanocrystalline Materials, Rome, Italy, May 20-24, 1996. Part1 pp.241-248, 1997. Zuerich, Switzerland. Trans Tech Publications
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Current developments in optical design and optical engineering VIII : 19-21 July 1999, Denver, Colorado. pp.334-343, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Laser processing of materials and industrial applications II : 16-19 September 1998, Beijing, China. pp.80-84, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Infrared spaceborne remote sensing V : 30 July-1 August 1997, San Diego, California. pp.88-91, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Automated optical inspection for industry : 6-7 November 1996, Beijing, China. pp.311-318, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Lasers as tools for manufacturing II : 12-14 February 1997, San Jose, California. pp.76-81, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical remote sensing of the atmosphere and clouds : 15-17 September 1998, Beijing, China. pp.521-530, 1998. Bellingham. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Current developments in optical elements and manufacturing : 16-18 September 1998, Beijing, China. pp.276-281, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Laser interferometry IX : techniques and analysis : 20-21 July 1998, San Diego, California. pp.393-404, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Fiber optic components and optical communication II : 18-19 September, 1998, Beijing, China. pp.108-113, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Application of tunable diode and other infrared sources for atmospheric studies and industrial process monitoring : 8-9 August 1996, Denver, Colorado. pp.142-147, 1996. Bellingham, WA. SPIE-The International Society for Optical Engineering
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International Conference on Sensors and Control Techniques (ICSC 2000). pp.469-472, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering