Near-field Raman spectral measurement of monocrystalline silicon by apertureless SNOM in reflection geometry
- Author(s):
- Publication title:
- Nanophotonics, Nanostructure, and Nanometrology
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5635
- Pub. Year:
- 2004
- Page(from):
- 292
- Page(to):
- 296
- Pages:
- 5
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819455901 [0819455903]
- Language:
- English
- Call no.:
- P63600/5635
- Type:
- Conference Proceedings
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