1.

Conference Proceedings
Conference Proceedings
1. Effects of deposition conditions and annealing process on the infrared optical properties of diamond films grown by MPCVD
Wang, L. ; Xia, Y. ; Zhang, M. ; Su, Q. ; Gu, B. ; Lou, Y.
Pub. info.: Fifth International Conference on Thin Film Physics and Applications : 31 May-2 June, 2004, Shanghai, China.  pp.419-422,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5774
2.

Conference Proceedings
Conference Proceedings
2. Charge collection properties of 1×128 array radiation detector based on CVD diamond film
Gu, B. ; Wang, L. ; Xia, Y. ; Zhang, M. ; Lou, Y. ; Su, Q.
Pub. info.: Fifth International Conference on Thin Film Physics and Applications : 31 May-2 June, 2004, Shanghai, China.  pp.411-414,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5774
3.

Conference Proceedings
Conference Proceedings
3. Optimization for the growth of CVD diamond on Al2O3 and the response to alpha particle irradiation
Lou, Y. ; Wang, L. ; Zhang, M. ; Gu, B. ; Su, Q. ; Xia, Y.
Pub. info.: Fifth International Conference on Thin Film Physics and Applications : 31 May-2 June, 2004, Shanghai, China.  pp.415-418,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5774
4.

Conference Proceedings
Conference Proceedings
4. Energy resolution in x-ray detecting microstrip gas chamber fabricated on CVD diamond films
Zhang, M. ; Xia, Y. ; Wang, L. ; Yang, Y. ; Gu, B.
Pub. info.: Fifth International Conference on Thin Film Physics and Applications : 31 May-2 June, 2004, Shanghai, China.  pp.91-94,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5774