1.

Conference Proceedings
Conference Proceedings
1. Electronic Defects and Interface Potentials for Al Oxide Films on Al and Their Relationship to Electrochemical Properties
Sullivan, J.P. ; Dunn, R.G. ; Barbour, J.C. ; Wall, F.D. ; Missert, N. ; Buchheil, R.G.
Pub. info.: Oxide Films : proceedings of the International Symposium.  pp.24-35,  2000.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-4
2.

Conference Proceedings
Conference Proceedings
2. Aluminum Corrosion at Systems of Engineered Cu Particles
Missert, N. ; Copeland, R.G. ; Wall, F.D. ; Johnson, C.M. ; Barbour, J.C. ; Kotula, P.
Pub. info.: Corrosion science : a retrospective and current status in honor of Robert P. Frankenthal : proceedings of the international symposium.  pp.307-313,  2002.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-13
3.

Conference Proceedings
Conference Proceedings
3. Generation of Chloride Active Defects at the Aluminum Oxide Surface for the Study of Localized Corrosion Initiation
Zavadil, K.R. ; Barbour, J.C. ; Wall, F.D. ; Son, K.-A. ; Missert, N.
Pub. info.: Proceedings of the Symposium on Critical Factors in Localized Corrosion III : a symposium in honor of the 70th birthday of Jerome Kruger.  pp.713-718,  1998.  Pennington, New Jersey.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 98-17
4.

Conference Proceedings
Conference Proceedings
4. CREVICE CORROSION INITIATION AT ENGINEERED Cu-RICH DEFECTS IN Al THIN FILMS
Missert, N. ; Son, K.A. ; Wall, F.D. ; Barbour, J.C. ; Sullivan, J.P. ; Zavadil, K.R. ; Copeland, R.G. ; Martinez, M.A. ; Buchheit, R.G. ; Jeffcoate, C.S. ; Isaacs, H.S.
Pub. info.: Corrosion and reliability of electronic materials and devices : proceedings of the fourth international symposium.  pp.36-44,  1999.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 99-29