Razeghi,M. ; Zhang,X. ; Kung,P. ; Saxier,A. ; Walker,D. ; Lim,K. Y. ; Kim,K. S.
Pub. info.:
Solid state crystals in optoelectronics and semiconductor technology : 7-11 October 1996, Zakopane, Poland. pp.2-11, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Photodetectors : materials and devices V : 26-28 January 2000, San Jose, California. pp.265-272, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Photodetectors : materials and devices III : 28-30 January 1998, San Jose, California. pp.214-220, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Epilayers and heterostructures in optoelectronics and semiconductor technology : International Conference on Solid State Crystals '98 : 12-16 October 1998, Zakopane, Poland. pp.14-20, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Photodetectors : materials and devices II : 12-14 February 1997, San Jose, California. pp.267-274, 1997. Bellingham, WA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Proceedings of the Tenth International Workshop on the Physics of Semiconductor Devices (December 14-18, 1999). Part1 pp.197-203, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part2 pp.1161-1166, 1997. Zurich, Switzerland. Trans Tech Publications
Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part2 pp.1229-1234, 1997. Zurich, Switzerland. Trans Tech Publications
Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part2 pp.1081-1086, 1997. Zurich, Switzerland. Trans Tech Publications
Photodetectors : materials and devices IV : 27-29 January 1999, San Jose, California. pp.193-198, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Photodetectors : materials and devices IV : 27-29 January 1999, San Jose, California. pp.211-222, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Photodetectors : materials and devices IV : 27-29 January 1999, San Jose, California. pp.223-229, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
A collection of technical papers : AIAA Guidance, Navigation and Control Conference and Exhibit, Portland, Oregon 9-11 August 1999. Pt. 3 pp.1605-1612, 1999. Reston, VA. American Institute of Aeronautics and Astronautics
Title of ser.:
AIAA Paper : AIAA Guidance Navigation and Control Conference
In-Plane Semiconductor Lasers: from Ultraviolet to Mid-Infrared II. pp.113-121, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering