Arent, D.J. ; Kocha, S.S. ; Peterson, M.W ; Rosenwaks, Y. ; Gruenbaum, E. ; Turner, J.A.
Pub. info.:
Proceedings of the Symposium on Wide Bandgap Semiconductors and Devices and the Twenty-Third State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XXIII). pp.285-306, 1995. Pennington, NJ. Electrochemical Society
Smart structures and materials 2003 : Smart systems and nondestructive evaluation for civil infrastructures : 3-6 March 2003, San Diego, California, USA. pp.551-558, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Nondestructive Evaluation and Reliability of Micro- and Nanomaterial Systems. pp.93-104, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Smart Nondestructive Evaluation for Health Monitoring of Structural and Biological Systems. pp.231-240, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Hurley, D.C. ; Wiehn, J.S. ; Turner, J.A. ; Rice, P.
Pub. info.:
Nondestructive Evaluation and Reliability of Micro- and Nanomaterial Systems. pp.65-73, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Nondestructive Evaluation and Reliability of Micro- and Nanomaterial Systems. pp.74-84, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering