1.

Conference Proceedings
Conference Proceedings
1. *AN INTERFACIAL PHASE TRANSFORMATION IN CoSi2/Si (111)
Eaglesham, D.J. ; Tung, R.T. ; Headrick, R.L. ; Robinson, I.K. ; Schrey, F.
Pub. info.: Atomic scale structure of interfaces : symposium held November 27-29, 1989, Boston Massachusetts, U.S.A..  pp.141-146,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 159
2.

Conference Proceedings
Conference Proceedings
2. GROWTH OF THIN EPITAXIAL CoSi2 LAYERS ON Si (100)
Yalisove, S.M. ; Tung, R.T. ; Batstone, J.L.
Pub. info.: Heteroepitaxy on silicon : fundamentals, structure, and devices : symposium held April 5-8, 1988, Reno, Nevada, U.S.A..  pp.439-446,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 116
3.

Conference Proceedings
Conference Proceedings
3. SILICIDE AS DOPANT SOURCE: ULTRASHALLOW N AND P JUNCTIONS IN SILICON
Herner, S.B. ; Gossmann, H.-J. ; Tung, R.T. ; Gila, B.P.
Pub. info.: Silicon materials science and technology : proceedings of the Eighth International Symposium on Silicon Materials Science and Technology.  pp.1224-1231,  1998.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 98-1(2)
4.

Conference Proceedings
Conference Proceedings
4. The Effect of TiSi2 Film Thickness and Growth on the Point Defect Perturbance in Si
Hemer, S.B. ; Jones, K.S. ; Gossman, H.-J. ; Tung, R.T. ; Poate, J.M. ; Luftman, H.S.
Pub. info.: Proceedings of the Fourth International Symposium on Process Physics and Modeling in Semiconductor Technology.  pp.337-347,  1996.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 96-4
5.

Conference Proceedings
Conference Proceedings
5. ELECTRON BEAM INDUCED CURRENT STUDIES OF NICKEL SILICIDE/SILICON SCHOTTKY BARRIER HEIGHTS
Gibson, J.M. ; Joy, D.C. ; Tung, R.T. ; Ellison, J.L. ; Pimentel, C. ; Levi, A.F.J.
Pub. info.: Layered structures and epitaxy : symposium held December 2-4, 1985, Boston, Massachusetts, U.S.A..  pp.163-170,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 56
6.

Conference Proceedings
Conference Proceedings
6. GROWTH AND EPITAXIAL CoSi2 AND NiSi2 ON (111), (100) AND (110) Si AT ROOM TEMPERATURE
Tung, R.T. ; Schrey, F.
Pub. info.: Layered structures : heteroepitaxy, superlattices, strain, and metastability : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A..  pp.243-248,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 160
7.

Conference Proceedings
Conference Proceedings
7. *EPITAXIAL SILICIDES: A SUMMARY OF RECENT DEVELOPMENTS
Tung, R.T. ; Schrey, F.
Pub. info.: Interfacial structure, properties, and design : symposium held April 5-8, 1988, Reno, Nevada, U.S.A..  pp.559-572,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 122
8.

Conference Proceedings
Conference Proceedings
8. TOPOGRAPHY OF Si (111): CLEAN SURFACE PREPARATION AND SILICON MOLECULAR BEAM EPITAXY
Tung, R.T. ; Schrey, F. ; Eaglesham, D.J.
Pub. info.: Atomic scale structure of interfaces : symposium held November 27-29, 1989, Boston Massachusetts, U.S.A..  pp.321-326,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 159
9.

Conference Proceedings
Conference Proceedings
9. RECONSTRUCTION OF (100) SILICON/DISILICIDE INTERFACES
Loretto, D. ; Gibson, J.M. ; White, Alice E. ; Short, K.T. ; Tung, R.T. ; Yalisove, S.M. ; Batstone, J.L.
Pub. info.: High resolution microscopy of materials : symposium held November 29-December 1, 1988, Boston, Massachusetts, U.S.A..  pp.97-102,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 139
10.

Conference Proceedings
Conference Proceedings
10. *ELECTRICAL PROPERTIES OF EPITAXIAL SILICIDE-SILICON INTERFACES
Tung, R.T. ; Levi, A.F.J. ; Gibson, J.M. ; Ng, K.K. ; Chantre, A.
Pub. info.: Thin films : interfaces and phenomena : symposium held December 2-6, 1985, Boston, Massachusetts, USA.  pp.457-468,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 54
11.

Conference Proceedings
Conference Proceedings
11. ELECTRON TRANSPORT THROUGH EPTAXIAL METAL/SEMI-CONDUCTOR HETEROSTRUCTURES
Levi, A.F.J. ; Tung, R.T. ; Batstone, J.L. ; Gibson, J.M. ; Anzlowar, M. ; Chantre, A.
Pub. info.: Interfaces, superlattices, and thin films : symposium held December 1-6, 1986, Boston, Massachusetts, U.S.A..  pp.271-276,  1987.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 77
12.

Conference Proceedings
Conference Proceedings
12. THE FORMATION OF THIN LAYERS AND DOBLE HETEROSTRUCTURES OF EPITAXIAL SILICIDES
Tung, R.T. ; Gibson, J.M.
Pub. info.: Heteroepitaxy on silicon : symposium held April 16-18, 1986, Palo Alto, California, U.S.A..  pp.211-226,  1986.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 67
13.

Conference Proceedings
Conference Proceedings
13. ORIENTATIONS OF ULTRATHIN NiSi2 LAYERS ON Si
Tung, R.T.
Pub. info.: Interfaces, superlattices, and thin films : symposium held December 1-6, 1986, Boston, Massachusetts, U.S.A..  pp.259-264,  1987.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 77
14.

Conference Proceedings
Conference Proceedings
14. THE FABRICATION OF NiSi2/Si(100) INTERFACES WITH CONTROLLED MORPHOLOGIES
Sullivan, J.P. ; Tung, R.T. ; Schrey, F. ; Graham, W.R.
Pub. info.: Semiconductor heterostructures for photonic and electronic applications : symposium held November 30-December 4, 1992, Boston, Massachusetts, U.S.A..  pp.623-628,  1993.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 281
15.

Conference Proceedings
Conference Proceedings
15. GROWTH OF SINGLE CRYSTAL Si/NiSi2/Si(100) AND SiCoSi2/Si(100) STRUCTURES BY MOLECULAR BEAM EPITAXY AND FURNACE ANNEALING
Tung, R.T. ; Eaglesham, D.J. ; Schrey, F. ; Sullivan, J.P.
Pub. info.: Semiconductor heterostructures for photonic and electronic applications : symposium held November 30-December 4, 1992, Boston, Massachusetts, U.S.A..  pp.641-646,  1993.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 281
16.

Conference Proceedings
Conference Proceedings
16. Aspects of Enhanced Titanium Salicide Formation
Kappius, L. ; Tung, R.T.
Pub. info.: Rapid thermal and other short-time processing technologies : proceedings of the international symposium.  pp.139-150,  2000.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-9
17.

Conference Proceedings
Conference Proceedings
17. SURFACE STUDIES OF SILICON WITH A HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPE
Gibson, J.M. ; McDonald, M.L. ; Unterwald, F.C. ; Gossmann, H.-J. ; Bean, J.C. ; Tung, R.T.
Pub. info.: Layered structures and epitaxy : symposium held December 2-4, 1985, Boston, Massachusetts, U.S.A..  pp.39-42,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 56