1.

Conference Proceedings

Conference Proceedings
Im, J.S. ; Thompson, C.V. ; Tomita, H.
Pub. info.: Beam-solid interactions and transient processes : symposium held December 1-4, 1986, Boston, Massachusetts, U.S.A..  pp.555-560,  1987.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 74
2.

Conference Proceedings

Conference Proceedings
Tomita, H. ; Kojima, A. ; Usui, S.
Pub. info.: Materials issues in silicon integrated circuit processing : symposium held April 15-18, 1986, Palo Alto, California, U.S.A..  pp.125-132,  1986.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 71
3.

Conference Proceedings

Conference Proceedings
Tomita, H. ; Saito, M. ; Nadahara, S. ; Shiotani, H. ; Muraoka, H.
Pub. info.: Proceedings of the Fifth International Symposium on High Purity Silicon V.  pp.422-431,  1998.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 98-13
4.

Conference Proceedings

Conference Proceedings
Im, J. S. ; Chen, C. K. ; Thompson, C. V. ; Geis, M. W. ; Tomita, H.
Pub. info.: Silicon-on-insulator and buried metals in semiconductors : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A..  pp.169-174,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 107
5.

Conference Proceedings

Conference Proceedings
Nakamura, T. ; Ikeda, K. ; Tomita, H. ; Komiya, S. ; Nakajima, K.
Pub. info.: Advanced interconnects and contact materials and processes for future integrated circuits : symposium held April 13-16, 1998, San Francisco, California, U.S.A..  pp.213-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 514
6.

Conference Proceedings

Conference Proceedings
Eguchi, K. ; Hieda, K. ; Nakahira, J. ; Kiyotoshi, M. ; Nakabayashi, M. ; Yamazaki, S. ; Izuha, M. ; Aoyama, T. ; Tsunoda, K. ; Lin, J. ; Nakamura, K. ; Niwa, S. ; Tomita, H. ; Shimada, A. ; Kohyama, Y. ; Ishibashi, Y. ; Fukuzumi, Y. ; Arikado, T. ; Okumura, K.
Pub. info.: Ferroelectric thin films VIII : symposium held November 29-December 2, 1999, Boston, Massachusetts, U.S.A..  pp.3-,  2000.  Warrendale, PA.  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 596
7.

Conference Proceedings

Conference Proceedings
Tomita, H. ; Watanabe, K. ; Kawarabayashi, J. ; Iguchi, T.
Pub. info.: Hard X-ray and gamma-ray detector physics V : 4-5 August, 2003, San Diego, California.  pp.281-288,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5198
8.

Technical Paper

Technical Paper
Suzuki, S. ; Komatsu, Y. ; Yonezawa, S. ; Masui, K. ; Tomita, H.
Pub. info.: AIAA meeting papers on disc.  2005.  [Reston, Va.].  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA Guidance Navigation and Control Conference
Ser. no.: 2005
9.

Conference Proceedings

Conference Proceedings
Kobayashi, Y. ; Yoshii, Y. ; Minezaki, T. ; Enya, K. ; Aoki, T. ; Suganuma, M. ; Tomita, H. ; Doi, M. ; Motohara, K. ; Peterson, B.A. ; Smith, C.H. ; Little, J.K. ; Greene, B.
Pub. info.: Large Ground-based Telescopes.  Part Two  pp.954-964,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4837
10.

Conference Proceedings

Conference Proceedings
Vishnu, V. ; Randall, M. ; Pillette, C.J. ; Katayama, K. ; Omura, K. ; Uemura, R. ; Tomita, H. ; Ando, R. ; Ogata, K. ; Maejima, H. ; DiDonato, A. ; Nicholson, J.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVIII.  pp.958-966,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5375