Van Lierde, P. ; Tian, C. ; Rothman, B. ; Hockett, R.A.
Pub. info.:
Photodetector materials and devices VII : 21-23 January 2002, San Jose, USA. pp.229-233, 2002. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Lierde, P. V. ; Tian, C. ; Hockett, R.A. ; Wei, L. ; Hockett, D.S. ; Alejandro, P.C. ; Keller, S. ; DenBaars, S.P.
Pub. info.:
State-of-the-art program on compound semiconductors XLI and nitride and wide bandgap semiconductors for sensors, photonics, and electronics V : proceedings of the international symposia. pp.535-539, 2004. Pennington, N.J.. Electrochemical Society
Lierde, P. van ; Tian, C. ; Rothman, B. ; Hockett, R.A.
Pub. info.:
Progress in semiconductor materials for optoelectronic applications : symposium held November 26-29, 2001, Boston, Massachusetts, U.S.A. pp.543-548, 2002. Warrendale, Pa.. Materials Research Society
Conference Proceedings
