Reliability, testing, and characterization of MEMS/MOEMS : 22-24 October 2001, San Trancisco, USA. pp.242-253, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
MEMS reliability for critical and space applications : 21-22 September 1999, Santa Clara, California. pp.30-39, 1999. Bellingham, Washington. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
MEMS reliability for critical and space applications : 21-22 September 1999, Santa Clara, California. pp.156-164, 1999. Bellingham, Washington. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering