Heterodyne interferometer for film thickness and refractive index measurements of optical thin film

Heterodyne interferometer for film thickness and refractive index measurements of optical thin film

Author(s):

Shimizu,N. ( Shibaura Institute of Technology )
Yuguchi,J.
Takahashi,H.

Publication title:

International Symposium on Polarization Analysis and Applications to Device Technology

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

2873

Pub. Year:

1996

Page(from):

123

Page(to):

126

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819422712 [0819422711]

Language:

English

Call no.:

P63600/2873

Type:

Conference Proceedings

Details

TDL ID:	ZA00017962
Series ID:	PA00000029
Conf. info. (Name):	International Symposium on Polarization Analysis and Applications to Device Technology
Conf. info. (Number):	1996
Conf. info. (Venue):	Yokohama, Japan
Conf. info. (Date):	1996.06.12-1996.06.14

Similar Items:

1 Conference Proceedings Dispersion-assisted measurement of the refractive index and thickness by hybrid interferometer S. Kim, J. Na, M. J. Kim, B. H. Lee Society of Photo-optical Instrumentation Engineers	7 Conference Proceedings A Low-Coherence Interferometer System for Simultaneous Measurement of Refractive Index and Thickness Ranging from 20μm to a Few Millimeters Inoue, S., Maruyama, H., Mitsuyama, T., Ohmi, M., Ihara, K., Haruna, M. SPIE - The International Society of Optical Engineering
2 Conference Proceedings Simultaneous measurement of the refractive index, thickness, and position of suspended thin film [6343-71] Lai, C.-C., Cheng, C.-H., Chiu, W.-C., Hsu, I-J. SPIE - The International Society of Optical Engineering	8 Conference Proceedings Interferometric measurement of refractive index profiles for thin film characterization Sheppard,C.J.R. SPIE-The International Society for Optical Engineering
3 Conference Proceedings Measurements of material refractive index with a circular heterodyne interferometer [5856-74] Jian, Z.-C., Lin, J.-Y., Hsieh, P.-J., Su, D.-C. SPIE - The International Society of Optical Engineering	9 Conference Proceedings Determination of the mean refractive index and thickness of dichromated gelatin holographic films using the thin film resonance method H.D. Tholl, M. Doehmen, C.G. Stojanoff Society of Photo-optical Instrumentation Engineers
4 Conference Proceedings In situ measurement of humidity induced changes in the refractive index and thickness of polyethylene glycol thin films B. Bilen, Y. Skarlatos, G. Aktas, M. N. Inci, T. Dispinar Society of Photo-optical Instrumentation Engineers	10 Conference Proceedings THICKNESS MEASUREMENTS AND OPTICAL CHARACTERIZATION OF THIN POLYMER FILMS Wall, J. F., Brumfield, J. C., Murray, R. W., Irene, E. A. MRS - Materials Research Society
5 Conference Proceedings Simultaneous measurements of thin-film thickness and refractive index by dispersive white-light interferometry Y.-S. Ghim, J. You, S.-W. Kim Society of Photo-optical Instrumentation Engineers	11 Conference Proceedings Measurement of the thickness of the tympanic membrane in cat using a heterodyne interferometer Decraemer, W. F. S., Khanna, S. M., Dirckx, J. J. J. SPIE - The International Society of Optical Engineering
6 Conference Proceedings Measurements of refractive index and physical thickness using optical coherence tomography Song,G., Wang,X., Ren,H., Zhang,W., Zhang,L., Fang,Z. SPIE - The International Society for Optical Engineering	12 Conference Proceedings Measurement of the Non-Linear Refractive Index of some Metallocenes by the Optical Power LimiterTechnique Winter S. C., Olivre N. S., Rush D. J. Kluwer Academic Publishers

1

2

3

4

5

6

7

8

9

10

11

12