Blank Cover Image

Design of high-resolution XUV imaging spectrometer using spherical varied line-space grating

Author(s):
Publication title:
X-ray and EUV/FUV spectroscopy and polarimetry : 11-12 July, 1995, San Diego, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2517
Pub. Year:
1995
Page(from):
107
Page(to):
115
Pages:
9
Pub. info.:
Bellingham, WA: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819418760 [0819418765]
Language:
English
Call no.:
P63600/2517
Type:
Conference Proceedings

Similar Items:

Poletto,L., Naletto,G., Tondello,G.

SPIE - The International Society for Optical Engineering

Thomas, R. J.

SPIE - The International Society of Optical Engineering

Watanabe,M., Toyoshima,A., Azuma,Y., Hayaishi,T., Yan,Y., Yagishita,A.

SPIE-The International Society for Optical Engineering

Xie, Y., He, S., Fu, S.

SPIE - The International Society of Optical Engineering

Amemiya,K., Kitajima,Y., Yonamoto,Y., Ohta,T., Ito,K., Sano,K., Nagano,T., Koeda,M., Sasai,H., Harada,Y.

SPIE-The International Society for Optical Engineering

Thomas, R.J.

SPIE-The International Society for Optical Engineering

Koike,M., Namioka,T., Gullikson,E.M., Harada,Y., Ishikawa,S., Imazono,T., Mrowka,S., Miyata,N., Yanagihara,M., …

SPIE-The International Society for Optical Engineering

Z. Liu, B. Liu, X. Xu, Y. Liu, Y. Hong

Society of Photo-optical Instrumentation Engineers

Palmer, Christopher, McKinney, Wayne R.

SPIE

H. Watanabe, S. Yoshida, Y. Kita, T. Hosoi, T. Shimura

Electrochemical Society

Wang,W., Chen,Y., Wang,X., Gao,J., Yang,H.

SPIE-The International Society for Optical Engineering

Fineschi, S., Korendyke, C. M., Moses, J. D., Thomas, R. J.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12