Color Moiré Interferometry for Shear Stress Sensor Application

Color Moiré Interferometry for Shear Stress Sensor Application

Author(s):

T. Chen ( Taitech Inc., Beavercreek, OH ) , ( University of Florida, Gainesville, FL )
S. Horowitz
M. Sheplak
G. Shoemaker ( NUWCD Navy, Newport, RI )

Publication title:

AIAA meeting papers on disc

Title of ser.:

AIAA Paper : Aerospace Sciences Meeting and Exhibit

Ser. no.:

2007

Pub. Year:

2007

No.:

2007-1261

Paper no.:

AIAA Paper 2007-1261

Pub. info.:

Reston, Va: American Institute of Aeronautics and Astronautics

ISSN:

10877215

Language:

English

Call no.:

A07400/200702 [CD-ROM 2007 Disc 2]

Type:

Technical Paper

Details

TDL ID:	ZA00050740
Series ID:	PA00000138
Conf. info. (Name):	AIAA Aerospace Sciences Meeting and Exhibit
Conf. info. (Number):	45th
Conf. info. (Venue):	Reno, Nevada
Conf. info. (Date):	2007.01.08-2007.01.11

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