Correlation between the g-r noise in semiconductor lasers and device reliability

Correlation between the g-r noise in semiconductor lasers and device reliability

Author(s):

Hu, G. ( Jilin Univ. (China) )

Sun, Y. ( Jilin Univ. (China) )

Zhang, H. ( Jilin Univ. (China) )

Li, J. ( Jilin Univ. (China) )

Shi, Y. ( Jilin Univ. (China) )

Shi, J. ( Jilin Univ. (China) )

1 more

Publication title:

Materials, Active Devices, and Optical Amplifiers

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5280

Pub. Year:

2004

Page(from):

229

Page(to):

232

Pages:

4

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819451750 [0819451754]

Language:

English

Call no.:

P63600/5280.1

Type:

Conference Proceedings

Details

TDL ID:	ZA00013622
Series ID:	PA00000029
Conf. info. (Name):	APOC : Asia Communications and Photonics
Conf. info. (Number):	2003
Conf. info. (Venue):	Wuhan, China
Conf. info. (Date):	2003.11.04-2003.11.06

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