Automatic inspection of small component on loaded PCB based on SVD and SVM [6315-30]
- Author(s):
- Publication title:
- Mathematics of Data/Image Pattern Recognition, Compression, and Encryption with Applications IX
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 6315
- Pub. Year:
- 2006
- Page(from):
- 63150P
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819463944 [0819463949]
- Language:
- English
- Call no.:
- P63600/6315
- Type:
- Conference Proceedings
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