1.

Conference Proceedings
Conference Proceedings
1. Thermal admittance studies of electron-irradiated CdGeAs2
Smith, S. R. ; Evwaraye, A. O. ; Ohmer, M. C. ; Drevinsky, P. J. ; Bliss, D. F.
Pub. info.: Infrared applications of semiconductors III : symposium held November 29-December 2, 1999, Boston, Massachusetts, U.S.A..  pp.403-,  2000.  Warrendale, Pa..  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 607
2.

Conference Proceedings
Conference Proceedings
2. Analysis of Cr-doped CdGeAs2 using thermal admittance spectroscopy
Smith, S. R. ; Evwaraye, A. O. ; Ohmer, M. C. ; Saxler, A. W. ; Goldstein, J. T. ; Solomon, J. ; Schunemann, P. G. ; Pollak, T. M.
Pub. info.: Infrared applications of semiconductors III : symposium held November 29-December 2, 1999, Boston, Massachusetts, U.S.A..  pp.465-,  2000.  Warrendale, Pa..  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 607
3.

Conference Proceedings
Conference Proceedings
3. Characterization of CdGeAs2 Using Capacitance Methods
Smith, S. R. ; Evwaraye, A. O. ; Ohmer, M. C.
Pub. info.: Infrared applications of semiconductors II : symposium held December 1-4, 1997, Boston, Massachusetts, U.S.A..  pp.581-,  1998.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 484