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Conference Proceedings

1. In-Situ X-ray Photoemission Spectromicroscopy of Electromigration in Patterned Al-Cu Lines With MAXIMUM

Solak, H. H. ; Lorusso, G. F. ; Singh, S. ; Cerrina, F. ; Underwood, J. H. ; Batson, P.

Pub. info.:	Materials reliability in microelectronics VIII : symposium held April 13-16, 1998, San Francisco, California, U.S.A.. pp.39-, 1998. Pittsburgh, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	516

Conference Proceedings

2. MAXIMUM AT ALS: A Powerful Tool to Investigate Open Problems in Micro- and Optoelectronics

Lorusso, G. F. ; Solak, H. ; Singh, S. ; Batson, P. J. ; Underwood, J. H. ; Cerrina, F.

Pub. info.:	Applications of synchrotron radiation techniques to materials science IV : sympoisum held April 13-17, 1998, San Francisco, California, U.S.A.. pp.215-, 1998. Warrendale, Penn.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	524

Conference Proceedings

3. A SPECTROMICROSCOPIC STUDY OF CORROSION IN Al-Cu-Si METALLIZATION

Liang, S. ; Ray-Chaudhuri, A. K. ; Ng, W. ; Singh, S. ; Welnak, J. T. ; Cerrina, F.

Pub. info.:	Materials reliability in microelectronics III : symposium held April 12-15, 1993, San Francisco, California, U.S.A.. pp.449-, 1993. Pittsburgh, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	309

Conference Proceedings

4. CHARACTERIZATION OF CLEAVED GaAs(110) WITH A SCANNING PHOTOEMISSION MICROSCOPE CAPABLE OF SUBMICRON RESOLUTION

Ray-Chaudhuri, A. K. ; Ng, W. ; Liang, S. ; Singh, S. ; Solak, H. ; Cerrina, F.

Pub. info.:	Applications of synchrotron radiation techniques to materials science : symposium held April 12-15, 1993, San Francisco, California, U.S.A.. pp.255-, 1993. Pittsburgh, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	307