1.

Conference Proceedings
Conference Proceedings
1. Lifetime and Leakage Current Studies in Shallow P-N Junctions
Poyai, A. ; Simoen, E. ; Claeys, C. ; Rooyackers, R. ; Badenes, G. ; Gaubas, E.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.403-413,  2000.  Bellingham, Wash..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-17
2.

Conference Proceedings
Conference Proceedings
2. Impact of the Generation Width on the Lifetime Extraction in Cz Siliconp-n Junction Diodes
Czerwinski, A. ; Simoen, E. ; Poyai, A. ; Claeys, C.
Pub. info.: Proceedings of the Third International Symposium on Defects in Silicon.  pp.88-99,  1999.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 99-1
3.

Conference Proceedings
Conference Proceedings
3. OPTIMISED DIODE ASSESSMENT OF THE SURFACE AND BULK GENERATION/RECOMBINATION PROPERTIES OF SILICON SUBSTRATE
Simoen, E. ; Poyai, A. ; Claeys, C. ; Czerwinski, A. ; Katcki, J.
Pub. info.: Silicon materials science and technology : proceedings of the Eighth International Symposium on Silicon Materials Science and Technology.  pp.1576-1592,  1998.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 98-1(2)
4.

Conference Proceedings
Conference Proceedings
4. Impact of STI Width and Spacing on the Stress Generation in Deep Submicron CMOS
Poyai, A. ; Rittaporn, I. ; Simoen, E. ; Claeys, C. ; Rooyackers, R.
Pub. info.: High purity silicon VIII : proceedings of the international symposium.  pp.307-316,  2004.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2004-05
5.

Conference Proceedings
Conference Proceedings
5. P-N Junction Diagnostics of the Electrical Epi-Layer Quality: A Feasibility Study
Simoen, E. ; Poyai, A. ; Claeys, C. ; Czerwinski, A.
Pub. info.: Proceedings of the Fifth International Symposium on High Purity Silicon V.  pp.410-421,  1998.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 98-13
6.

Conference Proceedings
Conference Proceedings
6. Potential and Pitfalls of the Diode Characterization Technique for ULSI Device Analysis
Poyai, A. ; Simoen, E. ; Claeys, C.
Pub. info.: Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah.  pp.386-395,  2003.  Pennington, NJ.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5133
7.

Conference Proceedings
Conference Proceedings
7. Impact of Thermal Budget on Junction Leakage in a 0.18 and 0.13 μm CMOS Technology
Poyai, A. ; Simoen, E. ; Claeys, C. ; Rooyackers, R. ; Redolfi, A.
Pub. info.: Microelectronics technology and devices : SBMICRO 2002 : proceedings of the seventeenth international symposium.  pp.213-222,  2002.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-8
8.

Conference Proceedings
Conference Proceedings
8. IMPACT OF STATE-OF-THE-ART Cz SUBSTRATES ON THE CURRENT-VOLTAGE CHARACTERSTiCS OF SHALLOW p-n JUNCTIONS
Poyai, A. ; Simoen, E. ; Claeys, C. ; Huber, A. ; Graef, D. ; Gaubas, E.
Pub. info.: Semiconductor silicon 2002 : proceedings of the ninth International Symposium on Silicon Materials Science and Technology.  pp.694-706,  2002.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-2
9.

Conference Proceedings
Conference Proceedings
9. Diode Analysis of Deep Submicron CMOS P-Well Implantation Damage
Poyai, A. ; Simoen, E. ; Claeys, C. ; Rooyackers, R.
Pub. info.: High purity silicon VII : proceedings of the international symposium.  pp.266-277,  2002.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-20
10.

Conference Proceedings
Conference Proceedings
10. The effect of substrate radiation-induced defects on the operation of deep submicron silicon technologies
Simoen, E. ; Claeys, C. ; Poyai, A.
Pub. info.: Crystalline defects and contamination: their impact and control in device manufacturing III : DECON 2001 : proceedings of the Satellite Symposium to ESSDERC 2001, Nuremberg, Germany.  pp.75-92,  2001.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-29