1.

Conference Proceedings
Conference Proceedings
1. Electron and ion beam-enhanced adhesion
Mitchell, I. V. ; Williams, J. S. ; Sood, D. K. ; Short, K. T. ; Johnson, S. ; Elliman, R. G.
Pub. info.: Thin films and interfaces II : symposium held November 1983, in Boston, Massachusetts, U.S.A..  pp.189-196,  1984.  New York.  North-Holland
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 25
2.

Conference Proceedings
Conference Proceedings
2. THE PRODUCTION OF POROUS STRUCTURES ON Si, Ge AND GaAs BY HIGH DOSE ION IMPLANTATION
Williams, J. S. ; Chivers, D. J. ; Elliman, R. G. ; Johnson, S. T. ; Lawson, E. M. ; Mitchell, I. V. ; Orrman-Rossiter, K. G. ; Pogany, A> P. ; Short, K. T.
Pub. info.: Ion implantation and ion beam processing of materials : symposium held November 1983 in Boston, Massachusetts, U.S.A..  pp.205-210,  1984.  New York.  North-Holland
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 27
3.

Conference Proceedings
Conference Proceedings
3. EPITAXIAL CRYSTALLIZATION OF DOPED AMORPHOUS SILICON
Elliman, R. G. ; Johnson, S. T. ; Short, K. T. ; Williams, S. J.
Pub. info.: Ion implantation and ion beam processing of materials : symposium held November 1983 in Boston, Massachusetts, U.S.A..  pp.229-234,  1984.  New York.  North-Holland
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 27
4.

Conference Proceedings
Conference Proceedings
4. ION-BEAM-INDUCED DAMAGING AND DYNAMIC ANNELAING PROCESSES IN SILICON
Short, K. T. ; Chivers, D. J. ; Elliman, R. G. ; Liu, J. ; Pogany, A. P. ; Wagenfeld, H. K. ; Williams, J. S.
Pub. info.: Ion implantation and ion beam processing of materials : symposium held November 1983 in Boston, Massachusetts, U.S.A..  pp.247-252,  1984.  New York.  North-Holland
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 27