1.

Conference Proceedings

Conference Proceedings
Schmid, U. ; Van Vechten, J.A. ; Myers, N.C. ; Koch, U.
Pub. info.: Impurities, defects, and diffusion in semiconductors : bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A..  pp.609-614,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 163
2.

Conference Proceedings

Conference Proceedings
Banc, C. ; Bano, E. ; Ouisse, T. ; Scharnholz, S. ; Schmid, U. ; Wondrak, W. ; Niemann, E.
Pub. info.: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.695-698,  2000.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 338-342(1)
3.

Technical Paper

Technical Paper
Ngo, L. ; Schmid, U. ; Kupke, W. ; Seidel, H.
Pub. info.: AIAA meeting papers on disc.  2004.  [Reston, Va.].  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : Conference on Micro-Nano-Technologies
Ser. no.: 2004
4.

Technical Paper

Technical Paper
Anzinger, C. ; Schmid, U. ; Krotz, G.
Pub. info.: 2002 SAE world congress : technical paper.  2002.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2002
5.

Technical Paper

Technical Paper
Schmid, U. ; Krotz, G.
Pub. info.: 2002 SAE world congress : technical paper.  2002.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2002