1.

Conference Proceedings
Conference Proceedings
1. FAILURE OF THE "KICK-OUT" MODEL FOR THE DIFFUSIN OF Au INTO Si WHEN TESTED BY MONTE CARLO SIMULATION
Schmid, U. ; Van Vechten, J.A. ; Myers, N.C. ; Koch, U.
Pub. info.: Impurities, defects, and diffusion in semiconductors : bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A..  pp.609-614,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 163
2.

Conference Proceedings
Conference Proceedings
2. Photon Emission Mechanisms in 6H and 4H-SiC MOSFETs
Banc, C. ; Bano, E. ; Ouisse, T. ; Scharnholz, S. ; Schmid, U. ; Wondrak, W. ; Niemann, E.
Pub. info.: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.695-698,  2000.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 338-342(1)