Systematic methodology for optimizing the trade-off of polysilicon depletion versus boron penetration in sub-0.18-ヲフm surface-channel PMOS devices
- Author(s):
Scott,G.S. ( VLSI Technology,Inc ) Saha,S.K. Olsen,C.S. Nouri,F. Lutze,J. Rubin,M.E. Manley,M. - Publication title:
- Microelectronic Device Technology III
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3881
- Pub. Year:
- 1999
- Page(from):
- 129
- Page(to):
- 137
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819434784 [0819434787]
- Language:
- English
- Call no.:
- P63600/3881
- Type:
- Conference Proceedings
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