Blank Cover Image

Hot-Carrier Effect in Submicron pMOSFETs

Author(s):
Saha, S.
Yeh, C. S.
Lindorfer, Ph.
Luo, J.
Nellore, U.
Gadepally, B.
1 more
Publication title:
Materials reliability in microelectronics V : symposium held April 17-21, 1995, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
391
Pub. Year:
1995
Page(from):
21
Pub. info.:
Pittsburgh, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558992948 [1558992944]
Language:
English
Call no.:
M23500/391
Type:
Conference Proceedings

Similar Items:

Janapaty,V., Bhuva,B.L., Bui,N., Kerns,S.E.

SPIE-The International Society for Optical Engineering

Asmontas, S., Gradauskas, J., Suziedelis, A., Sirmulis, E., Urbelis, A.

SPIE - The International Society of Optical Engineering

Phanse, Abhijit, Saha, Samar

MRS - Materials Research Society

Jie,B.B., Manna,I., Zeng,X., Guo,Q., Lo,K.F.

SPIE-The International Society for Optical Engineering

Lie,D.Y.C., Xia,W., Yota,J., Joshi,A.B., Zwingman,R., Williams,R., Kerametlian,V., Cerney,D., Min,B.W., Kwong,D.L.

SPIE-The International Society for Optical Engineering

Renn, S.H., Pelloie, J.L., Balestra, F.

Electrochemical Society

Vandenbroeck, J., Rempp, H., Swann, R. C. G.

Electrochemical Society

Brown,K.C., Hill,R., Reddy,K., Gadepally,K.

SPIE-The International Society for Optical Engineering

Saha, Samar K.

MRS - Materials Research Society

Zhao, X, Ioannou, D, Jenkins, W, Hughes, H, Liu, S T

Electrochemical Society

L.C. Yu, K.P. Cheung, J.S. Suehle, J.P. Campbell, K. Sheng

Trans Tech Publications

Kizilyalli,I.C., Abein,G., Chen,Z., Weber,G.R., Register,F., Harris,E., Chetlur,S., Higashi,G.S., Schofieled,M., Sen,S., …

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12