1.

Conference Proceedings

Conference Proceedings
Hautojarvi,P. ; Saarinen,K. ; Liszkay,L. ; Corbel,C. ; LeBerre,C.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.2  pp.923-928,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87
2.

Conference Proceedings

Conference Proceedings
Corbel,C. ; Pierre,F. ; Hautojarvi,P. ; Saarinen,K. ; Moser,P.
Pub. info.: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part2  pp.791-796,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 38-41
3.

Conference Proceedings

Conference Proceedings
Corbel,C. ; Hautojarvi,P. ; LeBerre,C. ; Liszkay,L. ; Saarinen,K.
Pub. info.: Positron annihilation : Proceedings of the 9th International Conference on Positron Annihilation, August 26-31, 1991, Szombathely, Hungary.  Pt.2  pp.933-936,  1992.  Aederlmannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 105-110
4.

Conference Proceedings

Conference Proceedings
Tomqvist,M. ; Nissila,J. ; Kiesling,F. ; Corbel,C. ; Saarinen,K. ; Seitsonen,A.P. ; Hautojarvi,P.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.347-352,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
5.

Conference Proceedings

Conference Proceedings
Gislason,H.P. ; Leosson,K. ; Svavarsson,H. ; Saarinen,K. ; Mari,A.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part3  pp.1813-1820,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
6.

Conference Proceedings

Conference Proceedings
Laine,T. ; Saarinen,K. ; Hautojarvi,P. ; Corbel,C. ; Pfeiffer,L.N. ; Citrin,P.H. ; Ashwin,M.J. ; Newman,R.C.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.879-884,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
7.

Conference Proceedings

Conference Proceedings
Corbel,C. ; Pierre,F. ; Hautojarvi,P. ; Saarinen,K. ; Moser,P.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.2  pp.979-984,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87
8.

Conference Proceedings

Conference Proceedings
Saarinen,K. ; Makinen,J. ; Hautojarvi,P. ; Kuisma,S. ; Laine,T. ; Corbel,C. ; LeBerre,C.(invited)
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.2  pp.983-990,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
9.

Conference Proceedings

Conference Proceedings
Saarinen,K. ; Makinen,J. ; Hautojarvi,P. ; Kuisma,S. ; Laine,T. ; Corbel,C. ; LeBerre,C.
Pub. info.: Positron annihilation : ICPA-10 : Proceedings of the 10th International Conference on Positron Annihilation, May 23-29, 1994, Beijing, China.  Part1  pp.501-504,  1995.  Aederlmannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 175-178
10.

Conference Proceedings

Conference Proceedings
Laine,T. ; Saarinen,K. ; Hautojarvi,P. ; Corbel,C. ; Ashwin,M.J. ; Newman,R.C.
Pub. info.: Positron annihilation, ICPA-11 : Proceedings of the 11th International Conference on Positron Annihilation, Kansas City, Missouri, USA, May 1997.  pp.551-553,  1997.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 255-257