1.

Conference Proceedings

Conference Proceedings
Laine,T. ; Saarinen,K. ; Hautojarvi,P. ; Corbel,C. ; Pfeiffer,L.N. ; Citrin,P.H. ; Ashwin,M.J. ; Newman,R.C.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.879-884,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
2.

Conference Proceedings

Conference Proceedings
Saarinen,K. ; Makinen,J. ; Hautojarvi,P. ; Kuisma,S. ; Laine,T. ; Corbel,C. ; LeBerre,C.(invited)
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.2  pp.983-990,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
3.

Conference Proceedings

Conference Proceedings
Saarinen,K. ; Makinen,J. ; Hautojarvi,P. ; Kuisma,S. ; Laine,T. ; Corbel,C. ; LeBerre,C.
Pub. info.: Positron annihilation : ICPA-10 : Proceedings of the 10th International Conference on Positron Annihilation, May 23-29, 1994, Beijing, China.  Part1  pp.501-504,  1995.  Aederlmannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 175-178
4.

Conference Proceedings

Conference Proceedings
Laine,T. ; Saarinen,K. ; Hautojarvi,P. ; Corbel,C. ; Ashwin,M.J. ; Newman,R.C.
Pub. info.: Positron annihilation, ICPA-11 : Proceedings of the 11th International Conference on Positron Annihilation, Kansas City, Missouri, USA, May 1997.  pp.551-553,  1997.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 255-257
5.

Conference Proceedings

Conference Proceedings
Laine,T. ; Makinen,J. ; Saarinen,K. ; Hautojarvi,P. ; Corbel,C. ; Gibart,P.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1073-1078,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201