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3D profilometry system based on absolute phase calibration

Author(s):
  • H. Yu ( Beijing Jiaotong Univ. (China) )
  • S. Shao ( Beijing Jiaotong Univ. (China) )
  • Z. Zhang ( Beijing Jiaotong Univ. (China) )
  • Q. Feng ( Beijing Jiaotong Univ. (China) )
Publication title:
Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo -Electronic Technology, and Artificial Intelligence : 13-15 October 2006, Beijing, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6357
Pub. Year:
2006
Pt.:
1
Paper no.:
63570M
Page(from):
63570M-1
Page(to):
63570M-6
Pages:
6
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819464521 [081946452X]
Language:
English
Call no.:
P63600/6357
Type:
Conference Proceedings

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