1.

Conference Proceedings
Conference Proceedings
1. Effects of Organic Additives on the Residual Stress of Ni and Ni Alloys Electrodeposited from the Sulfamate Bath
H. Kim ; Y. Kim ; S. Lee ; J. Lee ; M. Lee
Pub. info.: Magnetic Materials, Processes, and Devices 10.  pp.167-175,  2009.  Pennington, NJ.  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 16(45)
2.

Conference Proceedings
Conference Proceedings
2. The Electrical Properties of Low Temperature Polycrystalline Si Thin Film Transistor Prepared by Nickel-ALD Process
S. Lee ; C. Lee ; T. Jeong ; H. Kim
Pub. info.: Advanced gate stack, source/drain and channel engineering for Si-based CMOS 4 : new materials, processes and equipment.  pp.367-374,  2008.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 13(1)
3.

Conference Proceedings
Conference Proceedings
3. Low-k SiBN (Silicon Boron Nitride) Film Synthesized by a Plasma-Assisted Atomic Layer Deposition
S. Yang ; J. Kim ; J. Noh ; H. Kim ; S. Lee ; J. Ahn ; K. Hwang ; Y. Shin ; U. Chung ; J. Moon ; D. Lee ; I. Yi ; R. Jung ; S. Kang
Pub. info.: Atomic layer deposition : at the 208th ECS Meeting, October 16-21, 2005, Los Angeles, California, USA.  pp.79-94,  2006.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 1(10)
4.

Technical Paper
Technical Paper
4. Performance Comparison of .NET/C# and C++ in Implementing Satellite Ground Control System
S. Lee ; O. Jung ; S. Jeong ; H. Kim ; S. Lee ; J. Kim
Pub. info.: AIAA meeting papers on disc.  2006.  Reston, Va.  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA International Communications Satellite Systems Conference
Ser. no.: 2006
5.

Conference Proceedings
Conference Proceedings
5. Investigation of Hump Degradation by F-N stress for Narrow Width n-MOSFETs with Shallow Trench Isolation (STI)
J. Seo ; J. Seok ; H. Kim ; S. Lee ; J. Jeon
Pub. info.: 2007 International Conference on Semiconductor Technology for Ultra Large Scale Integrated Circuits and Thin Film Transistors (ULSIC vs. TFT).  pp.71-75,  2007.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 8(1)
6.

Conference Proceedings
Conference Proceedings
6. New PEC optimization for the mask fabrication of sub-50nm memory device
S. Lee ; D. Ryu ; J. Park ; D. Nam ; H. Kim ; B. Kim ; S. Woo ; H. Cho
Pub. info.: Photomask and next-generation lithography mask technology XIV.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6607
7.

Conference Proceedings
Conference Proceedings
7. Evaluation of litho printability of DRAM contact hole patterns with various programmed defects
K. Seo ; S. Lee ; H. Kim ; D. Hwang ; S. Kim ; G. Jeong ; O. Han ; C. Chen ; D. Yee ; E. Kim ; K. Park ; N. Kim ; S. Choi ; D. Kim ; S. Lohokare
Pub. info.: Photomask and next-generation lithography mask technology XIV.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6607
8.

Conference Proceedings
Conference Proceedings
8. Fabrication of 45o-micro-reflector-ended polymer waveguides using one-step UV embossing technique
S. An ; H. Lee ; S. Lee ; B. O ; H. Kim ; S. Park ; E. Lee
Pub. info.: Optoelectronic integrated circuits IX : 22-24 January 2007, San Jose, California.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6476
9.

Conference Proceedings
Conference Proceedings
9. Improvement of crosstalk on 5M CMOS image sensor with 1.7x1.7μm2 pixels
C. Koo ; H. Kim ; K. Paik ; D. Park ; K. Lee ; Y. Park ; C. Moon ; S. Lee ; S. Hwang ; D. Lee ; J. Kong
Pub. info.: Ultrafast phenomena in semiconductors and nanostructure materials XI and semiconductor photodetectors IV : 22-24 January 2007, San Jose, California, USA.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6471
10.

Conference Proceedings
Conference Proceedings
10. IntenCD: an application for CD uniformity mapping of photomask and process control at maskshops
H. Kim ; M. Lee ; S. Lee ; Y. -S. Sung ; B. Kim
Pub. info.: Photomask and next-generation lithography mask technology XV.  1  pp.70281K-1-70281K-6,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 7028