Testing highly aberrated large optics with a Shack-Hartmann wavefront sensor
- Author(s):
Neal, D.R. ( WaveFront Sciences, Inc. (USA) ) Pulaski, P. ( WaveFront Sciences, Inc. (USA) ) Raymond, T.D. ( WaveFront Sciences, Inc. (USA) ) Neal, D.A. ( WaveFront Sciences, Inc. (USA) ) Wang, Q. ( National Institute of Standards and Technology (USA) ) Griesmann, U. ( National Institute of Standards and Technology (USA) ) - Publication title:
- Advanced wavefront control : methods, devices, and applications : 6-7 August 2003, San Diego, California, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5162
- Pub. Year:
- 2003
- Page(from):
- 129
- Page(to):
- 138
- Pages:
- 10
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819450357 [0819450359]
- Language:
- English
- Call no.:
- P63600/5162
- Type:
- Conference Proceedings
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