1.

Conference Proceedings
Conference Proceedings
1. Characterization of SOI MOSFETs at microwave frequencies
Gillon, R. ; Raskin, J.P. ; Vanhoenacker, D. ; Colinge, J.P. ; Dambrine, G.
Pub. info.: Proceedings of the Eighth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.149-154,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-23
2.

Conference Proceedings
Conference Proceedings
2. Impact of down scaling on high-frequency noise performance of bulk and SOI MOSFETs (Invited Paper)
Dambrine, G. ; Raynaud, C. ; Vanmackelberg, M. ; Danneville, F. ; Pailloncy, G. ; Lepilliet, S. ; Raskin, J.P.
Pub. info.: Noise in Devices and Circuits.  pp.105-119,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5113