1.

Conference Proceedings

Conference Proceedings
Rafi, J.M. ; Simoen, E. ; Claeys, C. ; Ulyashin, A. ; Job, R. ; Fahrner, W. ; Versluys, J. ; Clauws, P. ; Lozano, M. ; Campabadal, F.
Pub. info.: Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah.  pp.96-105,  2003.  Pennington, NJ.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5133
2.

Conference Proceedings

Conference Proceedings
Job, R. ; Ulyashin, A.G. ; Ma, Y. ; Fahnwr, W.R. ; Simoen, E. ; Rafi, J.M. ; Claeys, C. ; Niedernostheide, F.J. ; Schulze, H.J.
Pub. info.: High purity silicon VII : proceedings of the international symposium.  pp.141-154,  2002.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-20