1.

Conference Proceedings
Conference Proceedings
1. In Situ Measurement of Nitrogen during Growth of 4H-SiC by CVD
B.L. Van Mil ; K.K. Lew ; R.L. Myers-Ward ; R.T. Holm ; D.K. Gaskill ; C.R. Eddy Jr
Pub. info.: Silicon carbide and related materials 2006 : ECSCRM 2006, Proceedings of the 6th European Conference on Silicon Carbide and Related Materials, Newcastle upon Tyne, UK, September 2006.  pp.125-128,  2007.  Stafa-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 556-557
2.

Conference Proceedings
Conference Proceedings
2. Temperature Dependent Chemical Sensitivity of Epitaxial Graphene
V.K. Nagareddy ; D.K. Gaskill ; J.L. Tedesco ; R.L. Myers-Ward ; C.R. Eddy
Pub. info.: Silicon carbide and related materials 2011 : selected, peer reviewed papers from the 14th International Conference on Silicon Carbide and Related Materials 2011 (ICSCRM 2011), September 11-16, 2011, Cleveland, Ohio, USA.  pp.691-694,  2012.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 717-720
3.

Conference Proceedings
Conference Proceedings
3. A Pictorial Tracking of Basal Plane Dislocations in SiC Epitaxy
R.E. Stahlbush ; R.L. Myers-Ward ; B.L. VanMil ; D.K. Gaskill ; C.R. Eddy Jr.
Pub. info.: Silicon carbide and related materials 2009 : selected peer reviewed papers from the International Conference on Silicon Carbide and Related Materials 2009, Nurnberg, Germany, October 11-16, 2009.  pp.271-276,  2010.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 645-648
4.

Conference Proceedings
Conference Proceedings
4. Etching of 4° and 8° 4H-SiC Using Various Hydrogen-Propane Mixtures in a Commercial Hot-Wall CVD Reactor
K.K. Lew ; B.L. Van Mil ; R.L. Myers-Ward ; R.T. Holm ; C.R. Eddy Jr. ; D.K. Gaskill
Pub. info.: Silicon carbide and related materials 2006 : ECSCRM 2006, Proceedings of the 6th European Conference on Silicon Carbide and Related Materials, Newcastle upon Tyne, UK, September 2006.  pp.513-516,  2007.  Stafa-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 556-557
5.

Conference Proceedings
Conference Proceedings
5. Comparative Investigation between X-Ray Diffraction and Cross Polarization Mapping of 4H-SiC Wafers Off-Cut 4° Towards (11-20)
D.K. Gaskill ; M.A. Mastro ; K.K. Lew ; B.L. Van Mil ; R.L. Myers-Ward ; R.T. Holm ; C.R. Eddy Jr
Pub. info.: Silicon carbide and related materials 2006 : ECSCRM 2006, Proceedings of the 6th European Conference on Silicon Carbide and Related Materials, Newcastle upon Tyne, UK, September 2006.  pp.235-238,  2007.  Stafa-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 556-557