1.

Conference Proceedings
Conference Proceedings
1. GROWN-IN MICRODEFECT DISTRIBUTION IN DOPED SILICON CRYSTALS
Borioneui, G. ; Gambaro, D. ; Porrini, M. ; Voronkov, V.V.
Pub. info.: Semiconductor silicon 2002 : proceedings of the ninth International Symposium on Silicon Materials Science and Technology.  pp.505-516,  2002.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-2
2.

Conference Proceedings
Conference Proceedings
2. GROWN-IN MICRODEFECT DISTRIBUTION IN DOPED SILICON CRYSTALS
Borioneui, G. ; Gambaro, D. ; Porrini, M. ; Voronkov, V.V.
Pub. info.: Semiconductor silicon 2002 : proceedings of the ninth International Symposium on Silicon Materials Science and Technology.  pp.505-516,  2002.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-2
3.

Conference Proceedings
Conference Proceedings
3. Influence of Oxygen and Oxygen Related Defects on the Minority Carrier Lifetime of High Purity CZ and MCZ Silicon
Porrini, M. ; Gambaro, D. ; Geranzani, P. ; Falster, R.
Pub. info.: Proceedings of the Fourth International Symposium on High Purity Silicon.  pp.170-179,  1996.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 96-13