1.

Conference Proceedings
Conference Proceedings
1. Gettering of Cu in silicon by silicon nitride precipitates
Popov, V.P. ; Tyschenko, I.E. ; Kachurin, G.A. ; Janovskaja, S.G. ; Obodnikov, V.I.
Pub. info.: Proceedings of the Symposium on Crystalline Defects and Contamination, their Impact and Control in Device Manufacturing II.  pp.309-317,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-22
2.

Conference Proceedings
Conference Proceedings
2. Formation and evolution of the oxygen precipitates in CZ-Si upon high pressure- high temperature treatment
Antonova, I.V. ; Misiuk, A. ; Popov, V.P. ; Plotnikov, A.E. ; Surma, B.
Pub. info.: Proceedings of the Symposium on Crystalline Defects and Contamination, their Impact and Control in Device Manufacturing II.  pp.98-106,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-22
3.

Conference Proceedings
Conference Proceedings
3. Traps at the Bonded Si/SiO2 Interface in Silicon-on-Insulator Structures
Antonova, I.V. ; Stano, J. ; Nikolaev, D.V. ; Naumova, O.V. ; Popov, V.P. ; Skuratov, V.A.
Pub. info.: Semiconductor wafer bonding : science, technology, and applications : proceedings of the international symposia.  pp.64-69,  2003.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-19
4.

Conference Proceedings
Conference Proceedings
4. Charge accumulation in oxides of SOI wafers fabricated by hydrogen slicing
Naumova, O.V. ; Frantzusov, A.A. ; Nikolaev, D.V. ; Popov, V.P.
Pub. info.: Silicon-on-insulator technology and devices XII : proceedings of the international symposium.  pp.255-260,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-03
5.

Conference Proceedings
Conference Proceedings
5. Low dimension properties of nanostructures on ultra thin layers of silicon formed by oxidation of ion cut SOI wafers and electron lithography
Popov, V.P. ; Aseev, A.L. ; Antonova, I.V. ; Nastaushev, Yu.V. ; Gavrilova, T.A. ; Naumova, O.V. ; Franzusov, A.A. ; Feafanov, G.N. ; Kolosanov, V.A.
Pub. info.: Progress in SOI structures and devices operating at extreme conditions.  pp.87-92,  2002.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 58
6.

Conference Proceedings
Conference Proceedings
6. Effect of Annealing at Argon Pressures up to 1.2 Gpa on Hydrogen-Plasma Etched and Hydrogen Implanted Single-Crystalline Silicon
Misiuk, A. ; Misiuk, J.B.K. ; Barcz, A. ; Romano-Rodriguez, A. ; Antonova, I.V. ; Popov, V.P. ; Londos, C.A. ; Jun, J.
Pub. info.: Hydrogen materials science and chemistry of metal hydrides.  pp.441-446,  2002.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 71
7.

Conference Proceedings
Conference Proceedings
7. Atomically Flat Surface of Hydrogen Transferred Si Film with Boron Delta Doped Layer
Popov, V.P. ; Safronov, L.V. ; Nikiforov, A.I. ; Sholz, R.
Pub. info.: Semiconductor wafer bonding : science, technology, and applications : proceedings of the international symposia.  pp.346-354,  2005.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-02
8.

Conference Proceedings
Conference Proceedings
8. Defects and their electronic properties in high-pressure-annealed SOI structures sliced by hydrogen
Popov, V.P. ; Gutakovskii, A.K. ; Safronov, L.N. ; Tyschenko, I.E. ; Zhuravlev, S.K. ; Talochkin, A.B. ; Antonova, A.I. ; Naumova, O.V. ; Obodikov, V.I. ; Misiuk, A. ; Bak-Misiuk, J. ; Domagala, J. ; Romano-Rodrigues, A. ; Bachrouri, A.
Pub. info.: Progress in SOI structures and devices operating at extreme conditions.  pp.269-288,  2002.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 58
9.

Conference Proceedings
Conference Proceedings
9. Changes In the parameters of silicon-on-insulator structures under irradiation
Antonova, I.V. ; Nikolaev, D.V. ; Nauniova, O.V. ; Smagulova, S.A. ; Popov, V.P.
Pub. info.: Silicon-on-insulator technology and devices XI : proceedings of the international symposium.  pp.505-510,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-5
10.

Conference Proceedings
Conference Proceedings
10. Total dose behavior of partially depleted DeleCut SOI MOSFETs
Naumova, O.V. ; Frantzusov, A.A. ; Antonova, I. V. ; Popov, V.P.
Pub. info.: Science and technology of semiconductor-on-insulator structures and devices operating in a harsh environment.  pp.227-232,  2005.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 185
11.

Conference Proceedings
Conference Proceedings
11. Radiation effects in SOI: Irradiation by high energy ions and electrons
Antonova, I.V. ; Stano, J. ; Naumova, O.V. ; Skuratov, V.A. ; Popov, V.P.
Pub. info.: Science and technology of semiconductor-on-insulator structures and devices operating in a harsh environment.  pp.215-220,  2005.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 185
12.

Conference Proceedings
Conference Proceedings
12. Gamma radiation tolerance of 0.5-μm SOI MOSFETs
Naumova, O.V. ; Frantsuzov, A.A. ; Popov, V.P.
Pub. info.: Micro- and Nanoelectronics 2003.  pp.332-336,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5401
13.

Conference Proceedings
Conference Proceedings
13. FET on ultrathin SOI (fabrication and research)
Naumova, O.V. ; Antonova, I.V. ; Popov, V.P. ; Nastaushev, Y.V. ; Gavrilova, T.A. ; Kachanova, M.M. ; Litvin, L.V. ; Aseev, A.L.
Pub. info.: Micro- and Nanoelectronics 2003.  pp.323-331,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5401