Blank Cover Image

Detonation discrimination and feature saliency using a near-infrared focal plane array and a visible CCD camera

Author(s):
Publication title:
Targets and backgrounds XI : characterization and representation : 28-29 March 2005, Orlando, Florida, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5811
Pub. Year:
2005
Page(from):
123
Page(to):
132
Pages:
10
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819457967 [0819457965]
Language:
English
Call no.:
P63600/5811
Type:
Conference Proceedings

Similar Items:

Dills, A.N., Perram, G.P., Gustafson, S.C.

SPIE - The International Society of Optical Engineering

Agranov,G.A., Novoselov,S.K., Nesterov,V.K., Sergeev,D.N.

SPIE-The International Society for Optical Engineering

Dills, A.N., Gross, K., Perram, G.P.

SPIE-The International Society for Optical Engineering

Chu,M., Terterian,S., Wang,P.C.C., Mesropian,S., Gurgenian,H.K., Pan,D.-S.

SPIE-The International Society for Optical Engineering

Sarathy,J., Gasparian,G.A., Lange,M.J., Cohen,M.J., Olsen,G.H., Kim,D.-S., Studenkov,P., Forrest,S.R.

SPIE-The International Society for Optical Engineering

Durand, A., de Borniol, E., Guerineau, N., Cathala, T., Yon, J.-J., Ouvrier-Buffet, J.-L., Castelein, P., Tronel, R., …

SPIE - The International Society of Optical Engineering

Ettenberg,M.H., Cohen,M.J., Olsen,G.H., Kennedy,J.J.

SPIE - The International Society for Optical Engineering

Gunapala, S.D., Liu, J.K., Sundaram, M., Park, J.S., Shott, C.A., Hoelter, T., Lin, T.L., Massie, S.T., Maker, P.D., …

Electrochemical Society

Gross, K.C., Dills, A.M., Perram, G.P., Tuttle, R.F.

SPIE-The International Society for Optical Engineering

de Borniol, E., Baylet, J.P., Zanatta, J.-P., Mibord, S., Gravrand, O., Rothan, F., Castelein, P., Chamonal, J.-P., …

SPIE-The International Society for Optical Engineering

Plotnikov,Yu.A., Winfree,W.P.

SPIE - The International Society for Optical Engineering

Lange,D.A., Vu,P., Wang,S.C., Jost,S.R., Winn,M.L., Roussis,J., Cook,R., Endres,D., Dudoff,G.K., Sanders, Jones,C.E., …

SPIE - The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12