1.

Conference Proceedings
Conference Proceedings
1. Compact broadband tunable short-pulse high-repetition-rate optical parametric oscillator
Peng, X. ; Xu, L. ; Asundi, A.
Pub. info.: Environmental monitoring and remediation III : 28-30 October 2003, Providence, Rhode Island, USA.  pp.214-220,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5270
2.

Conference Proceedings
Conference Proceedings
2. Numerical and experimental study diode-pumped Nd:YVO4 laser with undoped end cap
Peng, X. ; Xu, L. ; Asundi, A.
Pub. info.: Solid state lasers and amplifiers : 27-29 April 2004, Strasbourg, France.  pp.228-237,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5460
3.

Conference Proceedings
Conference Proceedings
3. Hybrid analysis of micromachined silicon thin film based on digital microscopic holography
Xu, L. ; Peng, X. ; Miao, J. ; Asundi, A. K.
Pub. info.: Optical Micro- and Nanometrology in Manufacturing Technology.  pp.236-243,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5458
4.

Conference Proceedings
Conference Proceedings
4. Development and validation of digital microholo interferometric system for micromechanical testing
Xu, L. ; Peng, X. ; Miao, J. ; Asundi, A.K.
Pub. info.: Interferometry XI: Applications.  pp.11-20,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4778
5.

Conference Proceedings
Conference Proceedings
5. Automated full-field interferometric characterization of micromachined silicon membrane
Xu, L. ; Peng, X. ; Miao, J. ; Asundi, A.K.
Pub. info.: Reliability, Testing, and Characterization of MEMS/MOEMS III.  pp.284-291,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5343