1.

Conference Proceedings
Conference Proceedings
1. An Investigation of the Electrically Active Defects in poly-Si Thin Film Transistors
Exarchos, M. ; Papaioannou, G.J. ; Kouvatsos, D.N. ; Voutsas, A.T.
Pub. info.: Thin Film Transistor Technologies (TFTT VII) : proceedings of the international symposium.  pp.125-129,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2004-15
2.

Conference Proceedings
Conference Proceedings
2. On the Electrical Properties of Silicon Wafer Bonding Structures: Evidence of Anomalous Pile-up of Phosphorus
Dimitrakis, P. ; Hatzandroulis, S. ; Tsoukalas, D. ; Stoimenos, J. ; Papaioannou, G.J.
Pub. info.: Proceedings of the Fourth International Symposium on Semiconductor Wafer Bonding : science, technology, and applications.  pp.373-380,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-36
3.

Conference Proceedings
Conference Proceedings
3. Some Organic-Inorganic Hybrid Semiconductors Obtained from Melts
Papavassiliou, G.C. ; Koutselas, I.B. ; Mousdis, G.A. ; Papaioannou, G.J.
Pub. info.: Molecular low dimensional and nanostructured materials for advanced applications.  pp.319-322,  2002.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 59
4.

Conference Proceedings
Conference Proceedings
4. Electrical characterization of the interface between buried oxide and silicon substrate
Dimitrakis, P. ; Papaioannou, G.J. ; Cristoloveanu, S.
Pub. info.: Proceedings of the Sixth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.230-235,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-11
5.

Conference Proceedings
Conference Proceedings
5. Defect creation mechanisms due to hot-carriers in 0.15 μm SIMOX MOSFETs
Dimitrakis, P. ; Jomaah, J. ; Balestra, F. ; Papaioannou, G.J.
Pub. info.: Progress in SOI structures and devices operating at extreme conditions.  pp.263-268,  2002.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 58