Human vision, visual processing, and digital display VI : 6-8 February 1995, San Jose, California. pp.100-110, 1994. Bellingham, WA. Society of Photo-optical Instrumentation Engineers
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Proceedings of SPIE - the International Society for Optical Engineering
P. Leray ; S. Cheng ; D. Kandel ; M. Adel ; A. Marchelli
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Metrology, inspection, and process control for microlithography XXII. 1 pp.69220O-1-69220O-12, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Metrology, inspection, and process control for microlithography XXII. 1 pp.69221E-1-69221E-11, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering