1.

Conference Proceedings
Conference Proceedings
1. Digital SPV Diffusion Length Metrology (E8-Fe) for Ultra-High Purity Silicon Wafers
M. Wilson ; A. Savtchouk ; I. Tasarov ; J. D'Amico ; P. Edelman
Pub. info.: High Purity Silicon 10.  pp.285-301,  2008.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 16(6)
2.

Conference Proceedings
Conference Proceedings
2. Surface Voltage and μPCD Mapping of Defect in Epitaxial SiC
M. Wilson ; A. Savtchouk ; A. Findlay ; J. Lagowski ; P. Edelman
Pub. info.: Silicon Carbide and Related Materials 2015 : [ICSCRM 2015] : selected, peer reviewed papers from the 16th International Conference on Silicon Carbide and Related Materials, October 4-9, 2015, Giardini Naxos, Italy.  pp.353-356,  2016.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 858
3.

Conference Proceedings
Conference Proceedings
3. New approach to measuring oxide charge and mobile ion concentration
P. Edelman ; A.M. Hoff ; L. Jastrzebski ; J. Lagowski
Pub. info.: Optical characterization techniques for high-performance microelectronic device manufacturing : 20 October 1994, Austin, Texas.  pp.154-164,  1994.  Bellingham, WA.  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2337