1.

Conference Proceedings

Conference Proceedings
Chen, Y. ; Liu, H. ; Deng, Y. ; Veksler, D.B. ; Shur, M.S. ; Zhang, X.-C. ; Schauki, D. ; Fitch, M.J. ; Osiander, R. ; Dodson, C. ; Spicer, J.B.
Pub. info.: Terahertz for military and security applications II : 12-13 April 2004, Orlando, Florida, USA.  pp.1-8,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5411
2.

Conference Proceedings

Conference Proceedings
Fitch, M.J. ; Schauki, D. ; Dodson, C. ; Osiander, R.
Pub. info.: Terahertz for military and security applications II : 12-13 April 2004, Orlando, Florida, USA.  pp.84-91,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5411
3.

Conference Proceedings

Conference Proceedings
Fitch, M. J. ; Dodson, C. ; Ziomek, D. S. ; Osiander, R.
Pub. info.: Chemical and biological standoff detection II : 27-28 October, 2004, Philadelphia, Pennsylvania, USA.  pp.16-22,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5584
4.

Conference Proceedings

Conference Proceedings
Dodson, C. ; Fitch, M. J. ; Osiander, R. ; Spicer, J. B.
Pub. info.: Terahertz for military and security applications III : 28-29 March 2005, Orlando, Florida, USA.  pp.85-93,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5790
5.

Conference Proceedings

Conference Proceedings
Fitch, M. J. ; Dodson, C. ; Chen, Y. ; Liu, H. ; Zhang, X. -C. ; Osiander, R.
Pub. info.: Terahertz for military and security applications III : 28-29 March 2005, Orlando, Florida, USA.  pp.281-288,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5790