1.

Conference Proceedings
Conference Proceedings
1. The scanning infra-red microscope: An alternative tool to measure bulk micro-defect density in semiconductors
Mule'Stagno, L. ; Bazzali, A. ; Olmo, M. ; Toeroek, P. ; Faister, R. ; Fraundorf, P.
Pub. info.: Proceedings of the Symposium on Crystalline Defects and Contamination, their Impact and Control in Device Manufacturing II.  pp.431-437,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-22
2.

Conference Proceedings
Conference Proceedings
2. An Investigation of the Limit of Detection and the Scattering Dependence of the Optical Precipitate Profiler (OPP)
Mule'stagno, L. ; Hill, D. E. ; Standley, R. ; Olmo, M. ; Holzer, J. C. ; Falster, R. ; Fraundorf, P.
Pub. info.: Defect and impurity engineered semiconductors, II : symposium held April 13-17, 1998, San Francisco, California, U.S.A..  pp.627-,  1998.  Warrendale, Pa.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 510