1.
|
Conference Proceedings
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Amano, T. ; Hiro-Oka, H. ; Choi, D. ; Furukawa, H. ; Kano, F. ; Takeda, M. ; Nakanishi, M. ; Shimizu, K. ; Obayashi, K.
Pub. info.: |
Interferometry XII: Techniques and Analysis. pp.375-382, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering |
Title of ser.: |
Proceedings of SPIE - the International Society for Optical Engineering |
Ser. no.: |
5531 |
|
2.
|
Conference Proceedings
|
Pawlowski, M. ; Sakano, Y. ; Miyamoto, Y. ; Takeda, M. ; Obayashi, K.
Pub. info.: |
Interferometry XII: Techniques and Analysis. pp.121-126, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering |
Title of ser.: |
Proceedings of SPIE - the International Society for Optical Engineering |
Ser. no.: |
5531 |
|