George, T. ; Weber, E. R. ; Nozaki, S. ; Wu, A. T. ; Umeno, M.
Pub. info.:
Epitaxial heterostructures : symposium held April 16-19, 1990, San Francisco, California, U.S.A.. pp.207-212, 1990. Pittsburgh, Pa.. Materials Research Society
Qi, Ming ; Luo, Jinsheng ; Shirakashi, J. ; Tokumitsu, E. ; Nozaki, S. ; Konagai, M. ; Takahashi, K.
Pub. info.:
Semiconductor heterostructures for photonic and electronic applications : symposium held November 30-December 4, 1992, Boston, Massachusetts, U.S.A.. pp.167-172, 1993. Pittsburgh, Pa.. Materials Research Society
Ichinohe, T. ; Masaki, S. ; Nozaki, S. ; Morisaki, H.
Pub. info.:
Proceedings of the International Symposium on Pits and Pores--Formation, Properties, and Significance for Advanced Luminescent Materials. pp.517-523, 1997. Pennington, NJ. Electrochemical Society
Proceedings of the Fourth International Symposium on Quantum Confinement : nanoscale materials, devices, and systems. pp.177-184, 1997. Pennington, NJ. Electrochemical Society
Show, Y. ; Nozaki, S. ; Morisaki, H. ; Iwase, M. ; Izumi, T.
Pub. info.:
Advanced luminescent materials and quantum confinement : proceedings of the international symposium. pp.3-9, 1999. Pennington, NJ. Electrochemical Society
Sato, K. ; Sugigama, Y. ; Izumi, T. ; Iwase, M. ; Show, Y. ; Nozaki, S. ; Morisaki, H.
Pub. info.:
Advanced luminescent materials and quantum confinement : proceedings of the international symposium. pp.240-245, 1999. Pennington, NJ. Electrochemical Society
Sohn, Hyunchul ; Weber, E. R. ; Nozaki, S. ; Konagal, M. ; Takahashi, K.
Pub. info.:
Defect engineering in semiconductor growth, processing and device technology : symposium held April 26-May 1, 1992, San Francisco, California, U.S.A.. pp.129-134, 1992. Pittsburgh, Pa.. Materials Research Society
Banerjee, S. ; Ono, H. ; Nozaki, S. ; Morisaki, H.
Pub. info.:
Microcrystalline and nanocrystalline semiconductors--1998 : symposium held November 30-December 3, 1998, Boston, Massachusetts, U.S.A.. pp.551-, 1999. Warrendale, PA. MRS - Materials Research Society
Sato, K. ; Sugiyama, Y. ; Izumi, T. ; Iwase, M. ; Show, Y. ; Nozaki, S. ; Morisaki, H.
Pub. info.:
Microcrystalline and nanocrystalline semiconductors--1998 : symposium held November 30-December 3, 1998, Boston, Massachusetts, U.S.A.. pp.57-, 1999. Warrendale, PA. MRS - Materials Research Society
Nozaki, S. ; Sato, S. ; Ono, H. ; Morisaki, H. ; Iwase, M.
Pub. info.:
Surface/interface and stress effects in electronic material nanostructures : symposium held November 27-December 1, 1995, Boston, Massachusetts, U.S.A.. pp.223-, 1996. Pittsburgh, Pa.. MRS - Materials Research Society
Advances in microcrystalline and nanocrystalline semiconductors, 1996 : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A.. pp.159-, 1997. Pittsburgh, Pa.. MRS - Materials Research Society
Chen, C. Y. ; Kimura, S. ; Sen, S. ; Nozaki, S. ; Ono, H. ; Uchida, K. ; Morisaki, H.
Pub. info.:
Group-IV semiconductor nanostructures : symposium held November 29-December 2, 2004, Boston, Massachusetts, U.S.A.. pp.249-256, 2005. Warrendale, Pa.. Materials Research Society
Ono, H. ; Ichinohe, T. ; Nozaki, S. ; Morisaki, H.
Pub. info.:
Proceedings of the Second International Symposium on Quantum Confinement Physics and Applications. pp.240-251, 1994. Pennington, NJ. Electrochemical Society
Si, Junjie ; Ono, H. ; Uchida, K. ; Nozaki, S. ; Morisaki, H.
Pub. info.:
Microcrystalline and nanocrystalline semiconductors-2000 : symposium held November 27-30, 2000, Boston, Massachusetts, U.S.A.. 2001. Warrendale, PA.. Materials Research Society
Sato, K. ; Izumi, T. ; Iwase, M. ; Show, Y. ; Nozaki, S. ; Morisaki, H.
Pub. info.:
Microcrystalline and nanocrystalline semiconductors-2000 : symposium held November 27-30, 2000, Boston, Massachusetts, U.S.A.. 2001. Warrendale, PA.. Materials Research Society
Nozaki, S. ; Chen, Y.-W. ; Nakao, Z. ; Shiraga, H.
Pub. info.:
Image processing : algorithms and systems : 21-23 January 2002, San Jose, USA. pp.303-311, 2002. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Schwitzgebel, J. ; Xiao, G. ; Bockwell, B. ; Nozaki, S. ; Darvish, A. ; Wu, C.
Pub. info.:
Metrology, Inspection, and Process Control for Microlithography XX. pp.61523H-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering