1.

Conference Proceedings
Conference Proceedings
1. Chemical Structures of Oxynitride/Si(100) Interface
Takahashi, K. ; Nohira, H. ; Kato, H. ; Tamura, N. ; Hikazutani, K. ; Sano, S. ; Hattori, T.
Pub. info.: The physics and chemistry of SiO2 and the Si-SiO2 interface-4, 2000 : proceedings of the fourth International Symposium on the Physics and Chemistry of SiO2 and the Si-SiO2 Interface, Tronto, Canada, May 15-18, 2000.  pp.181-186,  2000.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-2
2.

Conference Proceedings
Conference Proceedings
2. Characterization of Oxide Films on SiC Epitaxial (0001) Faces by Angle-Resolved Photoemission Spectroscopy Measurements Using Synchrotron Radiation
Hijikata, Y. ; Yaguchi, H. ; Yoshida, S. ; Takata, Y. ; Kobayashi, K. ; Shin, S. ; Nohira, H. ; Hattori, T.
Pub. info.: Silicon carbide and related materials 2004 : ECSCRM 2004 : proceedings of the 5th European Conference on Silicon Carbide and Related Materials, August 31 - September 4 2004, Bologna, Italy.  pp.585-588,  2005.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 483-485
3.

Conference Proceedings
Conference Proceedings
3. Surface Morphology of Ultrathin Oxide Formed on Si(100)
Hattori, T. ; Fujimura, M. ; Nohira, H.
Pub. info.: Ultrathin SiO[2] and high-K materials for USLI gate dielectrics : symposium held April 5-8, 1999, in San Francisco, California, U.S.A..  pp.163-,  1999.  Warrendale, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 567
4.

Conference Proceedings
Conference Proceedings
4. Detection of interfaces states correlated with layer-by-layer oxidation on Si(100)
Hattori, T. ; Nohira, H. ; Teramoto, Y. ; Watanabe, N.
Pub. info.: Structure and electronic properties of ultrathin dielectric films on silicon and related structures : symposium held November 29-December 1, 1999, Boston, Massachusetts, U.S.A..  pp.33-,  2000.  Warrendale, PA.  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 592
5.

Conference Proceedings
Conference Proceedings
5. INITIAL STAGE OF SiO2/Si INTERFACE FORMATION ON HYDROGEN-TERMINATED SILICON SURFACES
Hattori, T. ; Nohira, H. ; Ohishi, K. ; Shimizu, Y. ; Tamura, Y.
Pub. info.: Surface chemical cleaning and passivation for semiconductor processing.  pp.387-,  1993.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 315
6.

Conference Proceedings
Conference Proceedings
6. Angle-Resolved Photoelectron Spectroscopy Study on Gate Insulators
Nohira, H. ; Tamura, N. ; Ushio, J. ; Hattori, T.
Pub. info.: Silicon nitride, silicon dioxide thin insulating films, and other emerging dieletrics VIII : proceedings of the international symposium.  pp.19-32,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-01