1.

Conference Proceedings

Conference Proceedings
Neal, D.R. ; Copland, J. ; Neal, D.A.
Pub. info.: Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July 2002 Seattle, Washington, USA.  pp.148-160,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4779
2.

Conference Proceedings

Conference Proceedings
Neal, D.R. ; Pulaski, P. ; Raymond, T.D. ; Neal, D.A. ; Wang, Q. ; Griesmann, U.
Pub. info.: Advanced wavefront control : methods, devices, and applications : 6-7 August 2003, San Diego, California, USA.  pp.129-138,  2003.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5162