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Comparative Analysis of MBE-Grown GaN Films on SiC, ZnO and LiGaO2 Substrates

Author(s):
Yun, F.
Reshchikov, M.A.
He, L.
King, T.
Huang, D.
Morkoc, H.
Nause, Jeff
Cantwell, Gene
Maruska, H. Paul
Litton, C.W.
5 more
Publication title:
Defect and impurity engineered semiconductors and devices III : symposium held April 1-5, 2002, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
719
Pub. Year:
2002
Page(from):
41
Page(to):
48
Pages:
8
Pub. info.:
Warrendale, Pa: Materials Research Society
ISSN:
02729172
ISBN:
9781558996656 [1558996659]
Language:
English
Call no.:
M23500/719
Type:
Conference Proceedings

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