1.

Conference Proceedings
Conference Proceedings
1. Evaluation of Single-Event Upset Tolerance on Recent Commercial Memory ICs
Nemoto, N. ; Matsuzaki, K. ; Aoki, J. ; Akiitsu, T. ; Matsuda, S. ; Naito, I. ; Itoh, H. ; Nashiyama, I.
Pub. info.: Proceedings of the Third ESA Electronic Components Conference, EECC '97, ESTEC, Noordwijk, The Netherlands, 22-25 April 1997.  pp.461-466,  1997.  Noordwijk, The Netherlands.  European Space Agency
Title of ser.: ESA SP
Ser. no.: 395
2.

Conference Proceedings
Conference Proceedings
2. Development of 1M Gate CMOS Gate Array
Nemoto, N. ; Shindou, H. ; Makihara, A. ; Kuboyama, S. ; Matsuda, S. ; Sugimoto, K. ; Qikawa, K. ; Nashiyama, I. ; Itoh, H.
Pub. info.: Proceedings, European Space Components Conference, ESCCON 2000, 21-23 March 2000, ESTEC, Noordwijk, the Netherlands.  pp.325-330,  2000.  Noordwijk, The Netherlands.  ESA Publications Division
Title of ser.: ESA SP
Ser. no.: 439